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双折射相位解调器:在波片特性表征中的应用。

Birefringent phase demodulator: application to wave plate characterization.

作者信息

Veiras F E, Riobó L M, Matteo C L, Perez L I, Garea M T

出版信息

Appl Opt. 2015 Mar 20;54(9):2326-33. doi: 10.1364/AO.54.002326.

Abstract

The scope of this work is to present a phase demodulator that enables the recovery of temporal phase information contained in the phase difference between two signals with different polarizations. This demodulator is a polarization interferometer that may consist only of a uniaxial crystal slab and a polarizer sheet. The phase shift between two orthogonal components of the electric field is translated into space by means of birefringent crystals, which act as demodulators or phase analyzers with great robustness. The experimental scheme utilized is based on a simple conoscopic interference setup. Each portion of the space in which the interference pattern is projected contains not only the unknown temporal phase we want to recover, but also a phase shift due to the uniaxial crystal itself. The underlying idea is developing simultaneous phase shifting with uniaxial crystals. Thus, different phase recovery techniques can be applied in order to maximize their ability to track high-speed signals. Depending on the characteristics of the fringe pattern, it will permit phase recovery via different classical procedures. In order to prove the demodulator under different experimental and signal processing schemes, we employed it for wave plate characterization. The results obtained not only allow some wave plate features such as axes determination and retardance to be characterized, but also prove the working principle and capabilities of the demodulator.

摘要

这项工作的范围是展示一种相位解调器,它能够恢复包含在两个具有不同偏振态信号之间相位差中的时间相位信息。该解调器是一种偏振干涉仪,可能仅由一块单轴晶体平板和一片偏振片组成。电场的两个正交分量之间的相移通过双折射晶体转化为空间相移,双折射晶体作为解调器或相位分析仪,具有很强的鲁棒性。所采用的实验方案基于一个简单的锥光干涉装置。干涉图样投射到的空间的每一部分不仅包含我们想要恢复的未知时间相位,还包含由于单轴晶体本身引起的相移。其基本思想是利用单轴晶体实现同步相移。因此,可以应用不同的相位恢复技术,以最大限度地提高它们跟踪高速信号的能力。根据条纹图样的特征,它将允许通过不同的经典程序进行相位恢复。为了在不同的实验和信号处理方案下验证该解调器,我们将其用于波片特性表征。所获得的结果不仅能够表征波片的一些特性,如轴的确定和相位延迟,还证明了解调器的工作原理和能力。

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