Morana Adriana, Girard Sylvain, Marin Emmanuel, Lancry Matthieu, Marcandella Claude, Paillet Philippe, Lablonde Laurent, Robin Thierry, Williams Robert J, Withford Michael J, Boukenter Aziz, Ouerdane Youcef
Opt Express. 2015 Apr 6;23(7):8659-69. doi: 10.1364/OE.23.008659.
We compared the sensitivity to X-rays of several fiber Bragg gratings (FBGs) written in the standard telecommunication fiber Corning SMF28 with different techniques. Standard gratings were manufactured with phase-mask and UV lasers, continuum wave (cw) at 244 nm or pulsed in the nanosecond domain at 248 nm, in a pre-hydrogenated fiber. Others gratings were written by exposures to a femtosecond IR-laser (800 nm), with both phase-mask and point by point techniques. The response of these FBGs was studied under X-rays at room temperature and 100°C, by highlighting their similarities and differences. Independently of the inscription technique, the two types of fs-FBGs have showed no big difference up to 1 MGy(SiO(2)) dose. A discussion on the causes of the radiation-induced peak change is also reported.
我们比较了采用不同技术写入标准通信光纤康宁SMF28中的几种光纤布拉格光栅（FBG）对X射线的敏感性。标准光栅是在预氢化光纤中，使用相位掩膜和紫外激光器、244nm的连续波（cw）或248nm纳秒域的脉冲激光制造的。其他光栅是通过飞秒红外激光（800nm）曝光，采用相位掩膜和逐点技术写入的。通过突出它们的异同，研究了这些FBG在室温及100°C的X射线照射下的响应。与写入技术无关，在高达1MGy(SiO₂)剂量下，两种类型的飞秒FBG没有显示出太大差异。还报道了关于辐射诱导峰值变化原因的讨论。
