Yu Hyeon-Hye, Yi Chang-Hwan, Kim Chil-Min
Opt Express. 2015 May 4;23(9):11054-62. doi: 10.1364/OE.23.011054.
It was reported that Q spoiling in a chaotic microcavity is caused by chaos [PRL, 75, 2682 (1995)] and chaos-assisted tunneling [Nature 385, 45 (1997)]. However, even when a cavity is slightly deformed not to exhibit a broad chaotic region in phase space, high Q modes are spoiled. We find that Q spoiling in this region is caused by the transition of a whispering gallery mode (WGM) to a scarred resonance when a WGM interacts with its pair quasi-normal mode through an avoided resonance crossing. We prove that this transition induces Q spoiling in a quadrupole dielectric microcavity by showing that Q factors obtained from the Husimi functions depending on resonance deformation during the transition agree well with those obtained from the complex eigenvalues.
据报道，混沌微腔中的品质因数（Q）劣化是由混沌现象[《物理评论快报》，75卷，2682页（1995年）]和混沌辅助隧穿[《自然》385卷，45页（1997年）]引起的。然而，即使微腔稍有变形以至于在相空间中不呈现宽混沌区域时，高Q模式仍会劣化。我们发现，当回音壁模式（WGM）通过避免共振交叉与其准法向模式对相互作用时，该区域的Q劣化是由回音壁模式向疤痕共振的转变引起的。我们通过表明从取决于转变过程中共振变形的胡西米函数获得的品质因数与从复本征值获得的品质因数非常吻合，证明了这种转变在四极介质微腔中会引起Q劣化。
