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铁和(钴、铁)共掺杂氧化铜旋涂膜的结构、光学和光催化性能

Structural, optical and photocatalytic properties of Fe and (Co, Fe) co-doped copper oxide spin coated films.

作者信息

El Sayed A M, Shaban Mohamed

机构信息

Department of Physics, Faculty of Science, Fayoum University, Fayoum 63514, Egypt.

Nanophotonics and Applications (NPA) Lab, Department of Physics, Faculty of Science, Beni-Suef University, Beni-Suef 62514, Egypt.

出版信息

Spectrochim Acta A Mol Biomol Spectrosc. 2015 Oct 5;149:638-46. doi: 10.1016/j.saa.2015.05.010. Epub 2015 May 7.

Abstract

Copper oxide films with composition Cu1-x-yFexCoyO (where x⩽0.06 and y⩽0.03 in a molar ratio) and thickness of about 2 μm were spin coated onto ultrasonically cleaned glass substrates. These films were annealed at 500 °C in the air. XRD results show that films are CuO of polycrystalline and monoclinic structures without the detection of any Fe or Co traces. The average crystallite size of pure CuO is 20.44 nm reduced to 18.72 nm after Fe doping, then increased to 26.82 nm due to the co-doping with Co atoms. The optical band gap blue-shifted from 2.15 eV to 2.3 eV followed by red-shift to 2.15 eV after the Co incorporation. The influence of Fe doping and Co co-doping on the optical constants of CuO films as well as the photocatalytic removal of methylene blue (MB) dye is reported. The correlations between the structural modifications and the resultant optical properties are discussed. The obtained results of the fabricated system are compared with those of similar materials.

摘要

将组成为Cu1-x-yFexCoyO(摩尔比x⩽0.06且y⩽0.03)、厚度约为2μm的氧化铜薄膜旋涂到经过超声清洗的玻璃基板上。这些薄膜在空气中500°C退火。X射线衍射结果表明,薄膜为多晶和单斜结构的CuO,未检测到任何铁或钴的痕迹。纯CuO的平均微晶尺寸为20.44nm,铁掺杂后降至18.72nm,由于钴原子的共掺杂又增加到26.82nm。光学带隙先从2.15eV蓝移至2.3eV,钴掺入后又红移至2.15eV。报道了铁掺杂和钴共掺杂对CuO薄膜光学常数以及亚甲基蓝(MB)染料光催化去除的影响。讨论了结构改性与所得光学性能之间的相关性。将所制备系统的结果与类似材料的结果进行了比较。

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