利用雪崩光电二极管改进X射线检测和粒子识别。

Improved x-ray detection and particle identification with avalanche photodiodes.

作者信息

Diepold Marc, Fernandes Luis M P, Machado Jorge, Amaro Pedro, Abdou-Ahmed Marwan, Amaro Fernando D, Antognini Aldo, Biraben François, Chen Tzu-Ling, Covita Daniel S, Dax Andreas J, Franke Beatrice, Galtier Sandrine, Gouvea Andrea L, Götzfried Johannes, Graf Thomas, Hänsch Theodor W, Hildebrandt Malte, Indelicato Paul, Julien Lucile, Kirch Klaus, Knecht Andreas, Kottmann Franz, Krauth Julian J, Liu Yi-Wei, Monteiro Cristina M B, Mulhauser Françoise, Naar Boris, Nebel Tobias, Nez François, Santos José Paulo, dos Santos Joaquim M F, Schuhmann Karsten, Szabo Csilla I, Taqqu David, Veloso João F C A, Voss Andreas, Weichelt Birgit, Pohl Randolf

机构信息

Max Planck Institute of Quantum Optics, 85748 Garching, Germany.

LIBPhys, Physics Department, Universidade de Coimbra, 3004-516 Coimbra, Portugal.

出版信息

Rev Sci Instrum. 2015 May;86(5):053102. doi: 10.1063/1.4921195.

DOI:10.1063/1.4921195

PMID:26026509

Abstract

Avalanche photodiodes are commonly used as detectors for low energy x-rays. In this work, we report on a fitting technique used to account for different detector responses resulting from photoabsorption in the various avalanche photodiode layers. The use of this technique results in an improvement of the energy resolution at 8.2 keV by up to a factor of 2 and corrects the timing information by up to 25 ns to account for space dependent electron drift time. In addition, this waveform analysis is used for particle identification, e.g., to distinguish between x-rays and MeV electrons in our experiment.

摘要

雪崩光电二极管通常用作低能X射线探测器。在这项工作中，我们报告了一种拟合技术，该技术用于解释由于在各个雪崩光电二极管层中的光吸收而导致的不同探测器响应。使用该技术可使8.2 keV处的能量分辨率提高多达2倍，并将定时信息校正多达25 ns，以考虑与空间相关的电子漂移时间。此外，这种波形分析用于粒子识别，例如在我们的实验中区分X射线和MeV电子。