Son Taehwang, Lee Wonju, Kim Donghyun
School of Electrical and Electronic Engineering Yonsei University, Seoul, 120-749 Korea.
Sci Rep. 2015 Jul 23;5:12365. doi: 10.1038/srep12365.
In this study, we have investigated localization-based microscopy to achieve full-field super-resolution. For localized sampling, we have considered combs consisting of unit pulses and near-fields localized by surface nanoapertures. Achievable images after reconstruction were assessed in terms of peak signal-to-noise ratio (PSNR). It was found that spatial switching of individual pulses may be needed to break the diffraction limit. Among the parameters, the resolution was largely determined by sampling period while the effect of width of a sampling pulse on PSNR was relatively limited. For the range of sampling parameters that we considered, the highest resolution achievable is estimated to be 70 nm, which can further be enhanced by optimizing the localization parameters.
在本研究中，我们研究了基于定位的显微镜技术以实现全场超分辨率。对于局部采样，我们考虑了由单位脉冲组成的梳状信号以及由表面纳米孔径定位的近场。根据峰值信噪比（PSNR）评估重建后的可实现图像。发现可能需要单个脉冲的空间切换来突破衍射极限。在这些参数中，分辨率在很大程度上由采样周期决定，而采样脉冲宽度对PSNR的影响相对有限。对于我们考虑的采样参数范围，估计可实现的最高分辨率为70纳米，通过优化定位参数可进一步提高分辨率。
