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真空退火对 ZnO 纳米片导电特性的影响。

Effects of Vacuum Annealing on the Conduction Characteristics of ZnO Nanosheets.

机构信息

Multidisciplinary Nanotechnology Centre, College of Engineering, Swansea University, Singleton Park, Swansea, SA2 8PP, UK.

Department of Physics, College of Science, Swansea University, Singleton Park, Swansea, SA2 8PP, UK.

出版信息

Nanoscale Res Lett. 2015 Dec;10(1):368. doi: 10.1186/s11671-015-1066-1. Epub 2015 Sep 17.

Abstract

ZnO nanosheets are a relatively new form of nanostructure and have demonstrated potential as gas-sensing devices and dye sensitised solar cells. For integration into other devices, and when used as gas sensors, the nanosheets are often heated. Here we study the effect of vacuum annealing on the electrical transport properties of ZnO nanosheets in order to understand the role of heating in device fabrication. A low cost, mass production method has been used for synthesis and characterisation is achieved using scanning electron microscopy (SEM), photoluminescence (PL), auger electron spectroscopy (AES) and nanoscale two-point probe. Before annealing, the measured nanosheet resistance displayed a non-linear increase with probe separation, attributed to surface contamination. Annealing to 300 °C removed this contamination giving a resistance drop, linear probe spacing dependence, increased grain size and a reduction in the number of n-type defects. Further annealing to 500 °C caused the n-type defect concentration to reduce further with a corresponding increase in nanosheet resistance not compensated by any further sintering. At 700 °C, the nanosheets partially disintegrated and the resistance increased and became less linear with probe separation. These effects need to be taken into account when using ZnO nanosheets in devices that require an annealing stage during fabrication or heating during use.

摘要

氧化锌纳米片是一种相对较新的纳米结构形式,已被证明具有作为气体传感器和染料敏化太阳能电池的潜力。为了将其集成到其他设备中,并且当用作气体传感器时,纳米片通常会被加热。在这里,我们研究了真空退火对氧化锌纳米片的电输运性能的影响,以了解加热在器件制造中的作用。我们使用了一种低成本、大规模生产的方法进行合成,并通过扫描电子显微镜(SEM)、光致发光(PL)、俄歇电子能谱(AES)和纳米尺度两点探针对其进行了表征。在退火之前,测量的纳米片电阻显示出与探针间距的非线性增加,这归因于表面污染。退火至 300°C 可以去除这种污染,从而降低电阻,使探针间距呈线性依赖关系,晶粒尺寸增大,n 型缺陷数量减少。进一步退火至 500°C 会导致 n 型缺陷浓度进一步降低,而纳米片电阻的增加并没有通过任何进一步的烧结来补偿。在 700°C 时,纳米片部分分解,电阻增加,并且与探针间距的线性关系变差。在制造过程中需要退火阶段或使用过程中需要加热的器件中使用氧化锌纳米片时,需要考虑这些影响。

https://cdn.ncbi.nlm.nih.gov/pmc/blobs/e5d7/4573738/f675afa98cd1/11671_2015_1066_Fig1_HTML.jpg

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