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电子背散射衍射中伪对称性问题的模式匹配方法

Pattern matching approach to pseudosymmetry problems in electron backscatter diffraction.

作者信息

Nolze Gert, Winkelmann Aimo, Boyle Alan P

机构信息

Dept 5.1, Federal Institute for Materials, Research and Testing (BAM), Unter den Eichen 87, 12205 Berlin, Germany.

Bruker Nano, Am Studio 2D, 12489 Berlin, Germany.

出版信息

Ultramicroscopy. 2016 Jan;160:146-154. doi: 10.1016/j.ultramic.2015.10.010. Epub 2015 Oct 23.

Abstract

We demonstrate an approach to overcome Kikuchi pattern misindexing problems caused by crystallographic pseudosymmetry in electron backscatter diffraction (EBSD) measurements. Based on the quantitative comparison of experimentally measured Kikuchi patterns with dynamical electron diffraction simulations, the algorithm identifies the best-fit orientation from a set of pseudosymmetric candidates. Using measurements on framboidal pyrite (FeS2) as an example, we also show the improvement of the orientation precision using this approach.

摘要

我们展示了一种方法,可克服电子背散射衍射(EBSD)测量中由晶体学赝对称性引起的菊池花样误标定问题。基于实验测量的菊池花样与动态电子衍射模拟的定量比较,该算法从一组赝对称候选取向中识别出最佳拟合取向。以莓球状黄铁矿(FeS2)的测量为例,我们还展示了使用此方法提高取向精度的情况。

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