Grzelakowski Krzysztof P
OPTICON Nanotechnology, Muchoborska 18, PL54-424 Wrocław, Poland.
Ultramicroscopy. 2016 May;164:78-87. doi: 10.1016/j.ultramic.2015.10.013. Epub 2015 Oct 22.
Since its introduction the importance of complementary k||-space (LEED) and real space (LEEM) information in the investigation of surface science phenomena has been widely demonstrated over the last five decades. In this paper we report the application of a novel kind of electron spectromicroscope Dual Emission Electron spectroMicroscope (DEEM) with two independent electron optical channels for reciprocal and real space quasi-simultaneous imaging in investigation of a Cs covered Mo(110) single crystal by using the 800eV electron beam from an "in-lens" electron gun system developed for the sample illumination. With the DEEM spectromicroscope it is possible to observe dynamic, irreversible processes at surfaces in the energy-filtered real space and in the corresponding energy-filtered kǁ-space quasi-simultaneously in two independent imaging columns. The novel concept of the high energy electron beam sample illumination in the cathode lens based microscopes allows chemically selective imaging and analysis under laboratory conditions.
自其问世以来，在过去的五十年里，互补的倒易空间（低能电子衍射，LEED）和实空间（低能电子显微镜，LEEM）信息在表面科学现象研究中的重要性已得到广泛证明。在本文中，我们报告了一种新型电子能谱显微镜——双发射电子能谱显微镜（DEEM）的应用，该显微镜具有两个独立的电子光学通道，用于在利用为样品照明而开发的“内透镜”电子枪系统产生的800eV电子束研究Cs覆盖的Mo(110)单晶时，实现倒易空间和实空间的准同时成像。使用DEEM能谱显微镜，可以在两个独立的成像柱中，在能量过滤的实空间和相应的能量过滤的k||空间中准同时观察表面的动态、不可逆过程。基于阴极透镜的显微镜中高能电子束样品照明的新概念允许在实验室条件下进行化学选择性成像和分析。
