Huang Lei, Lau S P, Yang H Y, Yu S F
School of Electrical and Electronic Engineering, Nanyang Technological University, Nanyang Avenue, 639798, Singapore.
Nanotechnology. 2006 Mar 28;17(6):1564-7. doi: 10.1088/0957-4484/17/6/005. Epub 2006 Feb 21.
The secondary electron emission (SEE) of ZnO-coated carbon nanotubes (CNTs) was measured using a biasing technique in a scanning electron microscope. The SEE yield of the ZnO-coated CNTs is higher than that of the ZnO film deposited on Si substrates. Direct observation of the variation in SEE from tip-end and non-CNT positions was demonstrated. Local measurement reveals that the SEE yield at the tip-end of the ZnO-coated CNTs is much higher than that of non-CNT positions. The enhancement of SEE is attributed to the strong local field generated at the tip of the CNTs.
利用扫描电子显微镜中的偏置技术测量了氧化锌包覆碳纳米管（CNTs）的二次电子发射（SEE）。氧化锌包覆碳纳米管的SEE产率高于沉积在硅衬底上的氧化锌薄膜的SEE产率。证明了对尖端和非碳纳米管位置处SEE变化的直接观察。局部测量表明，氧化锌包覆碳纳米管尖端的SEE产率远高于非碳纳米管位置的SEE产率。SEE的增强归因于碳纳米管尖端产生的强局部场。
