Tiznado William, Oña Ofelia B, Caputo María C, Ferraro Marta B, Fuentealba Patricio
Departamento de Ciencias Químicas, Facultad de Ecología y Recursos Naturales, Universidad Andres Bello, Av. República 275, Santiago-Chile, Departamento de Física, Facultad de Ciencias Exactas y Naturales, Universidad de Buenos Aires, Ciudad Universitaria - Pab. I., Argentina, and Departamento de Física, Universidad de Chile, Las Palmeras 3425, Santiago-Chile.
J Chem Theory Comput. 2009 Sep 8;5(9):2265-73. doi: 10.1021/ct900320r.
A theoretical study of two series of small clusters, Si3On(-) and Si6On(-) (n = 1-6), has been carried out. The minimum energy structures were produced adding an electron to neutral species followed by relaxation at the B3LYP-6-311G(2d) level. The vertical ionization energies (VIEs) were computed using the electron propagator theory (EPT) in two approximations, Unrestricted Outer Valence Green Functions (UOVGF) and partial third-order approximation (P3). In the series Si3On(-) the theoretical VIEs of the minimum energy structures agree well with experimental data. For the second series there are not experimental VIEs, and the theoretical results are predictions. The performance of EPT methodologies in conjunction with all-electron or pseudopotentials (PP) calculations is analyzed. The conjunction of P3 and PP approximation proves to be the most efficient and economical methodology to calculate the VIEs of small anionic silicon oxide clusters. In the series Si6On(-) different channels of fragmentation have been calculated. The results suggest that the fragments do not have drastic geometric changes and the anionic fragment corresponds to the atoms where the spin density of the initial large cluster is localized. The Fukui function calculated over selected optimized fragments predicts adequately the interaction between them to form large stable clusters.
对两个系列的小团簇Si3On(-) 和Si6On(-)(n = 1 - 6)进行了理论研究。通过向中性物种添加一个电子,然后在B3LYP - 6 - 311G(2d)水平上进行弛豫,得到了最低能量结构。使用电子传播子理论(EPT)的两种近似方法,即无限制外价格林函数(UOVGF)和部分三阶近似(P3),计算了垂直电离能(VIE)。在Si3On(-)系列中,最低能量结构的理论VIE与实验数据吻合良好。对于第二个系列,没有实验VIE,理论结果是预测值。分析了EPT方法与全电子或赝势(PP)计算相结合的性能。结果表明,P3和PP近似相结合是计算小阴离子氧化硅团簇VIE最有效和经济的方法。在Si6On(-)系列中,计算了不同的碎片化通道。结果表明,碎片没有剧烈的几何变化,阴离子碎片对应于初始大团簇自旋密度局域化的原子。在选定的优化碎片上计算的福井函数充分预测了它们之间形成大的稳定团簇的相互作用。