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在SuperXAS光束线处的快速扩展X射线吸收精细结构装置,用于具有10毫秒时间分辨率的原位X射线吸收光谱分析。

Quick-EXAFS setup at the SuperXAS beamline for in situ X-ray absorption spectroscopy with 10 ms time resolution.

作者信息

Müller Oliver, Nachtegaal Maarten, Just Justus, Lützenkirchen-Hecht Dirk, Frahm Ronald

机构信息

Department of Physics, University of Wuppertal, Gaußstraße 20, 42119 Wuppertal, Germany.

Paul Scherrer Institute, 5232 Villigen, Switzerland.

出版信息

J Synchrotron Radiat. 2016 Jan;23(1):260-6. doi: 10.1107/S1600577515018007. Epub 2016 Jan 1.

Abstract

The quick-EXAFS (QEXAFS) method adds time resolution to X-ray absorption spectroscopy (XAS) and allows dynamic structural changes to be followed. A completely new QEXAFS setup consisting of monochromator, detectors and data acquisition system is presented, as installed at the SuperXAS bending-magnet beamline at the Swiss Light Source (Paul Scherrer Institute, Switzerland). The monochromator uses Si(111) and Si(311) channel-cut crystals mounted on one crystal stage, and remote exchange allows an energy range from 4.0 keV to 32 keV to be covered. The spectral scan range can be electronically adjusted up to several keV to cover multiple absorption edges in one scan. The determination of the Bragg angle close to the position of the crystals allows high-accuracy measurements. Absorption spectra can be acquired with fast gridded ionization chambers at oscillation frequencies of up to 50 Hz resulting in a time resolution of 10 ms, using both scan directions of each oscillation period. The carefully developed low-noise detector system yields high-quality absorption data. The unique setup allows both state-of-the-art QEXAFS and stable step-scan operation without the need to exchange whole monochromators. The long-term stability of the Bragg angle was investigated and absorption spectra of reference materials as well as of a fast chemical reaction demonstrate the overall capabilities of the new setup.

摘要

快速扩展X射线吸收精细结构(QEXAFS)方法为X射线吸收光谱(XAS)增加了时间分辨率,并能够跟踪动态结构变化。本文介绍了一种全新的QEXAFS装置,该装置由单色仪、探测器和数据采集系统组成,安装在瑞士光源(瑞士保罗·谢尔研究所)的SuperXAS弯铁光束线上。单色仪使用安装在一个晶体台上的Si(111)和Si(311)切槽晶体,通过远程交换可覆盖4.0 keV至32 keV的能量范围。光谱扫描范围可通过电子方式调整至几keV,以便在一次扫描中覆盖多个吸收边。在晶体位置附近确定布拉格角可实现高精度测量。使用每个振荡周期的两个扫描方向,可通过快速网格化电离室在高达50 Hz的振荡频率下采集吸收光谱,时间分辨率为10 ms。精心开发的低噪声探测器系统可产生高质量的吸收数据。这种独特的装置既可以实现先进的QEXAFS,又可以进行稳定的步进扫描操作,而无需更换整个单色仪。研究了布拉格角的长期稳定性,参考材料以及快速化学反应的吸收光谱证明了新装置的整体性能。

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