Kim Do Hyun, Bark Chung Wung
J Nanosci Nanotechnol. 2015 Nov;15(11):8537-41. doi: 10.1166/jnn.2015.11460.
Recently, the discovery of a two-dimensional electron gas (2DEG) has brought about innovative applications in the area of nanoscale oxide devices. Currently, PLD (pulsed laser deposition) is the dominant deposition technique that is used to produce 2DEG. However, PLD is not a suitable growth technique for device applications because of its small deposition area. To demonstrate the capability to grow conductive interface with large-scale, we deposited the amorphous LAO layer on STO substrates within a 2 inch range by using off axis RF-sputtering method. This paper reports the deposition of conducting interface at LaAlO3/SrTiO3 heterointerface over 2-inch diameter. All samples exhibited conducting interface, however, the electrical and structural properties depend on the position of the deposition. While thinner film show higher conductivity, in terms of structural properties, the LAO/STO film deposited within the 1.35 inch range had the best surface among the samples.
最近,二维电子气(2DEG)的发现为纳米级氧化物器件领域带来了创新应用。目前,脉冲激光沉积(PLD)是用于制备二维电子气的主要沉积技术。然而,由于其沉积面积小,PLD并非适用于器件应用的生长技术。为了展示大规模生长导电界面的能力,我们采用离轴射频溅射法在2英寸范围内的STO衬底上沉积了非晶态LAO层。本文报道了在直径2英寸的LaAlO3/SrTiO3异质界面上导电界面的沉积情况。所有样品均呈现出导电界面,然而,电学和结构性能取决于沉积位置。虽然较薄的薄膜显示出更高的导电性,但就结构性能而言,在1.35英寸范围内沉积的LAO/STO薄膜在样品中具有最佳的表面质量。