Ströker Erwin, de Asmundis Carlo, Vanduynhoven Philippe, De Vadder Katrien, De Vusser Philip, Mullens Wilfried, Chierchia Gian-Battista, Brugada Pedro, Czapla Jens, La Meir Mark, Wellens Francis, Van Herendael Hugo, Rivero-Ayerza Maximo
Heart Rhythm Management Centre, Universitair Ziekenhuis Brussel-Vrije Universiteit Brussel, Brussels, Belgium.
Heart Rhythm Management Centre, Universitair Ziekenhuis Brussel-Vrije Universiteit Brussel, Brussels, Belgium.
Am J Cardiol. 2016 Mar 1;117(5):807-12. doi: 10.1016/j.amjcard.2015.12.013. Epub 2015 Dec 13.
Riata and Riata ST implantable cardioverter-defibrillator leads are prone to structural and electrical failure (EF). Our objective was to evaluate Riata/ST lead performance over a long-term follow-up. Of 184 patients having undergone Riata/ST and Riata ST Optim lead implantation from September 2003 to June 2008, 154 patients were evaluated for EF and radiographic conductor externalization (CE). Survival analysis for EF was performed for Riata/ST leads, both for failure-free lead survival and cumulative hazard. Subanalysis on 7Fr leads was performed to evaluate EF and CE rates both for different Riata ST lead management (monitoring vs proactive) and between Riata ST and Riata ST Optim leads. During a mean follow-up of 7 years, Riata/ST lead EF rate was 13% overall. Similar failure-free survival rate was noted for 7Fr as for 8Fr leads (log-rank, p = 0.63). Of all failed leads, 64% failed only after 5 years of follow-up. Compared with the absolute failure rate of 1.84% per device year, cumulative hazard analysis for leads surviving past 5 years revealed an estimated failure rate of 7% per year. No clinical or procedural predictors for EF were found. The subanalysis on 7Fr leads showed an excellent outcome both for a proactive lead management approach as for Optim leads. In conclusion, long-term survival of the Riata/ST lead is impaired with an accelerating EF risk over time. An initial exponential trend was followed by a linear lead failure pattern for leads surviving past 5 years, corresponding to an estimated 7% annual EF rate. These findings may have repercussions on the lead management strategy in patients currently surviving with a Riata/ST lead to prevent significant clinical events like inappropriate shocks or failed device interventions.
Riata和Riata ST植入式心脏复律除颤器导线容易出现结构和电气故障(EF)。我们的目的是评估Riata/ST导线在长期随访中的性能。在2003年9月至2008年6月期间接受Riata/ST和Riata ST Optim导线植入的184例患者中,对154例患者进行了EF和影像学导线外部化(CE)评估。对Riata/ST导线进行了EF的生存分析,包括无故障导线生存和累积风险。对7Fr导线进行亚分析,以评估不同Riata ST导线管理方式(监测与积极处理)以及Riata ST与Riata ST Optim导线之间的EF和CE发生率。在平均7年的随访期间,Riata/ST导线的总体EF发生率为13%。7Fr导线与8Fr导线的无故障生存率相似(对数秩检验,p = 0.63)。在所有发生故障的导线中,64%仅在随访5年后才出现故障。与每年每台设备1.84%的绝对故障率相比,对存活超过5年的导线进行累积风险分析显示,估计每年的故障率为7%。未发现EF的临床或操作预测因素。对7Fr导线的亚分析显示,积极的导线管理方法和Optim导线均有良好的结果。总之,Riata/ST导线的长期生存受到损害,随着时间的推移EF风险加速增加。最初呈指数趋势,随后对于存活超过5年的导线呈现线性故障模式,对应估计每年7%的EF发生率。这些发现可能会对目前使用Riata/ST导线存活的患者的导线管理策略产生影响,以预防诸如不适当电击或设备干预失败等重大临床事件。