Mangolini Filippo, McClimon J Brandon, Carpick Robert W
Institute of Functional Surfaces, School of Mechanical Engineering, University of Leeds , Leeds, LS2 9JT, U.K.
Department of Materials Science and Engineering, University of Pennsylvania , Philadelphia, Pennsylvania 19104, United States.
Anal Chem. 2016 Mar 1;88(5):2817-24. doi: 10.1021/acs.analchem.5b04525. Epub 2016 Feb 12.
The characterization of the local bonding configuration of carbon in carbon-based materials is of paramount importance since the properties of such materials strongly depend on the distribution of carbon hybridization states, the local ordering, and the degree of hydrogenation. Carbon 1s near edge X-ray absorption fine structure (NEXAFS) spectroscopy is one of the most powerful techniques for gaining insights into the bonding configuration of near-surface carbon atoms. The common methodology for quantitatively evaluating the carbon hybridization state using C 1s NEXAFS measurements, which is based on the analysis of the sample of interest and of a highly ordered pyrolytic graphite (HOPG) reference sample, was reviewed and critically assessed, noting that inconsistencies are found in the literature in applying this method. A theoretical rationale for the specific experimental conditions to be used for the acquisition of HOPG reference spectra is presented together with the potential sources of uncertainty and errors in the correctly computed fraction of sp(2)-bonded carbon. This provides a specific method for analyzing the distribution of carbon hybridization state using NEXAFS spectroscopy. As an illustrative example, a hydrogenated amorphous carbon film was analyzed using this method and showed good agreement with X-ray photoelectron spectroscopy (which is surface sensitive). Furthermore, the results were consistent with analysis from Raman spectroscopy (which is not surface sensitive), indicating the absence of a structurally different near-surface region in this particular thin film material. The present work can assist surface scientists in the analysis of NEXAFS spectra for the accurate characterization of the structure of carbon-based materials.
碳基材料中碳的局部键合构型的表征至关重要,因为这类材料的性质强烈依赖于碳杂化态的分布、局部有序性和氢化程度。碳1s近边X射线吸收精细结构(NEXAFS)光谱是深入了解近表面碳原子键合构型的最强大技术之一。本文回顾并批判性地评估了基于对感兴趣样品和高度有序热解石墨(HOPG)参考样品的分析,使用C 1s NEXAFS测量定量评估碳杂化态的常用方法,指出在应用该方法的文献中发现了不一致之处。本文给出了获取HOPG参考光谱所需特定实验条件的理论依据,以及正确计算的sp(2)键合碳分数中潜在的不确定度和误差来源。这提供了一种使用NEXAFS光谱分析碳杂化态分布的具体方法。作为一个示例,使用该方法分析了氢化非晶碳膜,结果与X射线光电子能谱(对表面敏感)显示出良好的一致性。此外,结果与拉曼光谱(对表面不敏感)的分析一致,表明在这种特定的薄膜材料中不存在结构不同的近表面区域。本工作有助于表面科学家分析NEXAFS光谱,以准确表征碳基材料的结构。