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位于块状Bi₂Se₃内部深处的Bi双层对电子结构的拓扑修饰。

Topological modification of the electronic structure by Bi-bilayers lying deep inside bulk Bi₂Se₃.

作者信息

Lee Paengro, Kim Jinwoong, Kim Jin Gul, Ryu Min-tae, Park Hee-min, Kim Namdong, Kim Yongsam, Lee Nam-Suk, Kioussis Nicholas, Jhi Seung-Hoon, Chung Jinwook

机构信息

Department of Physics, Pohang University of Science and Technology, Pohang 790-784, Korea.

出版信息

J Phys Condens Matter. 2016 Mar 2;28(8):085002. doi: 10.1088/0953-8984/28/8/085002. Epub 2016 Feb 8.

Abstract

We observe the modified surface states of an epitaxial thin film of a homologous series of (Bi2)m(Bi2Se3)n, as a topological insulator (TI), by angle-resolved photoemission spectroscopy measurements. A thin film with m : n  =  1 : 3 (Bi8Se9) has been grown with Bi2 bilayers embedded every other three quintuple layers (QLs) of Bi2Se3. Despite the reduced dimension of continuous QLs due to the Bi2 heterolayers, we find that the topological surface states stem from the inverted Bi and Se states and the topologically nontrivial structures are mainly based on the prototype of 3D TI Bi2Se3 without affecting the overall topological order.

摘要

我们通过角分辨光电子能谱测量,观察了作为拓扑绝缘体(TI)的同系物系列(Bi2)m(Bi2Se3)n外延薄膜的改性表面态。已经生长出了m∶n = 1∶3(Bi8Se9)的薄膜,其中Bi2双层每隔三层Bi2Se3的五重层(QLs)嵌入。尽管由于Bi2异质层导致连续QLs的维度降低,但我们发现拓扑表面态源于Bi和Se的反转态,并且拓扑非平凡结构主要基于三维TI Bi2Se3的原型,而不影响整体拓扑顺序。

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