Shimizu Kenichi, Driver Gordon W, Lucas Marie, Sparrman Tobias, Shchukarev Andrey, Boily Jean-François
Department of Chemistry, Umeå University, SE-901 87 Umeå, Sweden.
Dalton Trans. 2016 May 31;45(22):9045-50. doi: 10.1039/c5dt04425a.
This study uncovers bifluoride-type (difluorohydrogenate(i); HF2) species formed at mineral/water interfaces. Bifluoride forms at [triple bond, length as m-dash]Al-F surface sites resulting from the partial fluoridation of gibbsite (γ-Al(OH3)) and bayerite (α-Al(OH3)) particles exposed to aqueous solutions of 50 mM NaF. Fluoride removal from these solutions is proton-promoted and results in a strongly self-buffered suspensions at circumneutral pH, proceeds at a F : H consumption ratio of 2 : 1, and with recorded losses of up to 17 mM fluoride (58 F nm(-2)). These loadings exceed crystallographic site densities by a factor of 3-4, yet the reactions have no resolvable impact on particle size, shape and mineralogy. X-ray photoelectron spectroscopy (XPS) of frozen (-155 °C) wet mineral pastes revealed coexisting surface F(-) and HF(0) species. Electron energy loss features pointed to multilayer distribution of these species at the mineral/water interface. XPS also uncovered a distinct form of Na(+) involved in binding fluoride-bearing species. XPS and solid state magic angle spinning (19)F nuclear magnetic resonance measurements showed that these fluoride species were highly comparable to a sodium-bifluoride (NaHF2) reference. First layer surface species are represented as [triple bond, length as m-dash]Al-F-H-F-Al[triple bond, length as m-dash] and [triple bond, length as m-dash]Al-F-Na-F-Al[triple bond, length as m-dash], and may form multi-layered species into the mineral/water interface. These results consequently point to a potentially overlooked inorganic fluorine species in a technologically relevant mineral/water interfacial systems.
本研究揭示了在矿物/水界面形成的双氟化物型(氟氢化氢根负离子;[HF₂]⁻)物种。双氟化物在三水铝石(γ - Al(OH)₃)和拜耳石(α - Al(OH)₃)颗粒部分氟化形成的[三键,键长用m - 短划线表示]Al - F表面位点处形成,这些颗粒暴露于50 mM NaF水溶液中。从这些溶液中去除氟化物是由质子促进的,并且在接近中性的pH值下产生强自缓冲悬浮液,以F∶H消耗比2∶1进行,记录到的氟化物损失高达17 mM(58 F nm⁻²)。这些负载量比晶体学位点密度高出3 - 4倍,但这些反应对颗粒大小、形状和矿物学没有可分辨的影响。对冷冻(-155 °C)的湿矿物糊剂进行的X射线光电子能谱(XPS)分析揭示了共存的表面F⁻和HF⁰物种。电子能量损失特征表明这些物种在矿物/水界面呈多层分布。XPS还揭示了一种与含氟物种结合有关的独特形式的Na⁺。XPS和固态魔角旋转(¹⁹)F核磁共振测量表明,这些氟化物物种与氟化钠(NaHF₂)参考物高度可比。第一层表面物种表示为[三键,键长用m - 短划线表示]Al - F - H - F - Al[三键,键长用m - 短划线表示]和[三键,键长用m - 短划线表示]Al - F - Na - F - Al[三键,键长用m - 短划线表示],并且可能在矿物/水界面形成多层物种。因此,这些结果表明在技术相关的矿物/水界面系统中存在一种可能被忽视的无机氟物种。