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费米弧在Weyl半金属TaAs和NbP准粒子干涉中的特征

Signatures of Fermi Arcs in the Quasiparticle Interferences of the Weyl Semimetals TaAs and NbP.

作者信息

Chang Guoqing, Xu Su-Yang, Zheng Hao, Lee Chi-Cheng, Huang Shin-Ming, Belopolski Ilya, Sanchez Daniel S, Bian Guang, Alidoust Nasser, Chang Tay-Rong, Hsu Chuang-Han, Jeng Horng-Tay, Bansil Arun, Lin Hsin, Hasan M Zahid

机构信息

Centre for Advanced 2D Materials and Graphene Research Centre, National University of Singapore, 6 Science Drive 2, Singapore 117546.

Department of Physics, National University of Singapore, 2 Science Drive 3, Singapore 117542.

出版信息

Phys Rev Lett. 2016 Feb 12;116(6):066601. doi: 10.1103/PhysRevLett.116.066601. Epub 2016 Feb 10.

Abstract

The recent discovery of the first Weyl semimetal in TaAs provides the first observation of a Weyl fermion in nature. Such a topological semimetal features a novel type of anomalous surface state, the Fermi arc, which connects a pair of Weyl nodes through the boundary of the crystal. Here, we present theoretical calculations of the quasiparticle interference (QPI) patterns that arise from the surface states including the topological Fermi arcs in the Weyl semimetals TaAs and NbP. Most importantly, we discover that the QPI exhibits termination points that are fingerprints of the Weyl nodes in the interference pattern. Our results, for the first time, propose a universal interference signature of the topological Fermi arcs in TaAs, which is fundamental for scanning tunneling microscope (STM) measurements on this prototypical Weyl semimetal compound. More generally, our work provides critical guideline and methodology for STM studies on new Weyl semimetals. Further, the scattering channels revealed by our QPIs are broadly relevant to surface transport and device applications based on Weyl semimetals.

摘要

最近在TaAs中首次发现了外尔半金属,这是首次在自然界中观测到外尔费米子。这种拓扑半金属具有一种新型的反常表面态——费米弧,它通过晶体边界连接一对外尔点。在此,我们给出了由包括外尔半金属TaAs和NbP中的拓扑费米弧在内的表面态产生的准粒子干涉(QPI)图案的理论计算结果。最重要的是,我们发现QPI表现出终止点,这些终止点是干涉图案中外尔点的特征。我们的结果首次提出了TaAs中拓扑费米弧的通用干涉特征,这对于在这种典型的外尔半金属化合物上进行扫描隧道显微镜(STM)测量至关重要。更广泛地说,我们的工作为新型外尔半金属的STM研究提供了关键指导和方法。此外,我们的QPI所揭示的散射通道与基于外尔半金属的表面输运和器件应用广泛相关。

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