Zurek A K
Materials Science and Technology, Los Alamos National Laboratory, New Mexico 87545.
J Electron Microsc Tech. 1989 Feb;11(2):174-7. doi: 10.1002/jemt.1060110215.
A new stereo-imaging technique is described. This new technique uses both secondary electron and back scatter electron detectors simultaneously for imaging the fracture surfaces, pictures of which are used in stereo-imaging.
描述了一种新的立体成像技术。这种新技术同时使用二次电子探测器和背散射电子探测器对断裂表面进行成像，所得图像用于立体成像。
