Department of Mechanical and Industrial Engineering, University of Toronto, Toronto, ON, M5S 3G8, Canada.
Nanotechnology. 2016 Jul 15;27(28):28LT01. doi: 10.1088/0957-4484/27/28/28LT01. Epub 2016 Jun 3.
This paper reports in situ transmission electron microscopy (TEM) tensile testing of carbon-linked graphene oxide nanosheets using a monolithic TEM compatible microelectromechanical system device. The set-up allows direct on-chip nanosheet thickness mapping, high resolution electron beam linking of a pre-fractured nanosheet, and mechanical tensile testing of the nanosheet. This technique enables simultaneous mechanical and high energy electron beam characterization of 2D nanomaterials.
本文通过使用整体式与 TEM 兼容的微机电系统装置，报告了碳连接氧化石墨烯纳米片的原位透射电子显微镜 (TEM) 拉伸测试。该设置允许直接在芯片上对纳米片的厚度进行映射，对预先断裂的纳米片进行高分辨率电子束连接，并对纳米片进行机械拉伸测试。该技术使二维纳米材料的机械和高能电子束特性能够同时进行。
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