Anselmi Nicola, Salucci Marco, Rocca Paolo, Massa Andrea
ELEDIA@UniTN - University of Trento, Via Sommarive 9, I-38123 Trento, Italy.
ELEDIA@L2S - Laboratoire des Signaux et Systèmes, UMR8506 (CNRS - CS - UPS), 3 rue Joliot-Curie, 91192 Gif-sur-Yvette, France.
Sensors (Basel). 2016 May 31;16(6):791. doi: 10.3390/s16060791.
The sensitivity to both calibration errors and mutual coupling effects of the power pattern radiated by a linear array is addressed. Starting from the knowledge of the nominal excitations of the array elements and the maximum uncertainty on their amplitudes, the bounds of the pattern deviations from the ideal one are analytically derived by exploiting the Circular Interval Analysis (CIA). A set of representative numerical results is reported and discussed to assess the effectiveness and the reliability of the proposed approach also in comparison with state-of-the-art methods and full-wave simulations.
研究了线性阵列辐射功率方向图对校准误差和互耦效应的敏感性。从阵列单元标称激励及其幅度的最大不确定性出发，利用圆区间分析（CIA）解析推导了方向图与理想方向图偏差的界限。报告并讨论了一组具有代表性的数值结果，以评估所提方法的有效性和可靠性，同时与现有方法及全波仿真进行比较。
