Department of Chemistry, University of Wrocław, 14 F. Joliot-Curie, 50-383 Wrocław, Poland.
Department of Chemistry, University of Wrocław, 14 F. Joliot-Curie, 50-383 Wrocław, Poland.
Food Chem. 2016 Nov 15;211:560-3. doi: 10.1016/j.foodchem.2016.05.108. Epub 2016 May 17.
A procedure for the quantitative determination of gluten in wheat flour based on partial least squares (PLS) treatment of FT-Raman data is described. Results of similar quality were found using a PLS model derived from NIR (near infrared) spectra obtained in DRIFTS (diffuse reflectance infrared Fourier transform spectroscopy) mode and of slightly worse quality from the model constructed based on IR (infrared) spectra registered using a single reflection ATR (attenuated total reflection) diamond accessory. The relative standard errors of prediction (RSEP) were calculated for the calibration, validation and analysed data sets. These errors amounted to 3.2-3.6%, 3.5-3.8% and 4.8-5.7% for the three techniques applied, respectively. The proposed procedures can be used as simple, fast and accurate methods for the quantitative analysis of gluten in flour.
本文描述了一种基于傅里叶变换拉曼(FT-Raman)数据的偏最小二乘法(PLS)处理,定量测定小麦粉中面筋的方法。使用在漫反射红外傅里叶变换光谱(DRIFTS)模式下获得的近红外(NIR)光谱得出的 PLS 模型,以及使用单反射衰减全反射(ATR)金刚石附件记录的红外(IR)光谱构建的模型,得到了类似质量的结果,后者的质量稍差。分别为校准、验证和分析数据集计算了相对标准预测误差(RSEP)。对于所应用的三种技术,这些误差分别为 3.2-3.6%、3.5-3.8%和 4.8-5.7%。所提出的方法可以作为一种简单、快速和准确的方法,用于面粉中面筋的定量分析。