Han Zhao-ying, Zhu Xi-cun, Fang Xian-yi, Wang Zhuo-yuan, Wang Ling, Zhao Geng-Xing, Jiang Yuan-mao
Guang Pu Xue Yu Guang Pu Fen Xi. 2016 Mar;36(3):800-5.
Leaf area index (LAI) is the dynamic index of crop population size. Hyperspectral technology can be used to estimate apple canopy LAI rapidly and nondestructively. It can be provide a reference for monitoring the tree growing and yield estimation. The Red Fuji apple trees of full bearing fruit are the researching objects. Ninety apple trees canopies spectral reflectance and LAI values were measured by the ASD Fieldspec3 spectrometer and LAI-2200 in thirty orchards in constant two years in Qixia research area of Shandong Province. The optimal vegetation indices were selected by the method of correlation analysis of the original spectral reflectance and vegetation indices. The models of predicting the LAI were built with the multivariate regression analysis method of support vector machine (SVM) and random forest (RF). The new vegetation indices, GNDVI527, ND-VI676, RVI682, FD-NVI656 and GRVI517 and the previous two main vegetation indices, NDVI670 and NDVI705, are in accordance with LAI. In the RF regression model, the calibration set decision coefficient C-R2 of 0.920 and validation set decision coefficient V-R2 of 0.889 are higher than the SVM regression model by 0.045 and 0.033 respectively. The root mean square error of calibration set C-RMSE of 0.249, the root mean square error validation set V-RMSE of 0.236 are lower than that of the SVM regression model by 0.054 and 0.058 respectively. Relative analysis of calibrating error C-RPD and relative analysis of validation set V-RPD reached 3.363 and 2.520, 0.598 and 0.262, respectively, which were higher than the SVM regression model. The measured and predicted the scatterplot trend line slope of the calibration set and validation set C-S and V-S are close to 1. The estimation result of RF regression model is better than that of the SVM. RF regression model can be used to estimate the LAI of red Fuji apple trees in full fruit period.
叶面积指数(LAI)是作物群体大小的动态指标。高光谱技术可用于快速、无损地估算苹果冠层LAI。它可为监测树木生长和产量估算提供参考。以盛果期红富士苹果树为研究对象。在山东省栖霞研究区连续两年,使用ASD Fieldspec3光谱仪和LAI - 2200测量了30个果园中90棵苹果树冠层的光谱反射率和LAI值。通过原始光谱反射率与植被指数的相关分析方法选择最优植被指数。利用支持向量机(SVM)和随机森林(RF)的多元回归分析方法建立了LAI预测模型。新的植被指数GNDVI527、ND - VI676、RVI682、FD - NVI656和GRVI517以及前两个主要植被指数NDVI670和NDVI705与LAI具有一致性。在RF回归模型中,校正集决定系数C - R2为0.920,验证集决定系数V - R2为0.889,分别比SVM回归模型高0.045和0.033。校正集均方根误差C - RMSE为0.249,验证集均方根误差V - RMSE为0.236,分别比SVM回归模型低0.054和0.058。校正误差C - RPD的相对分析和验证集V - RPD的相对分析分别达到3.363和2.520、0.598和0.262,高于SVM回归模型。校正集和验证集的测量值与预测值散点图趋势线斜率C - S和V - S接近1。RF回归模型的估计结果优于SVM。RF回归模型可用于估算盛果期红富士苹果树的LAI。