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通过光谱椭偏仪测量的CHNHPbBr钙钛矿薄膜的光学常数。

Optical constants of CHNHPbBr perovskite thin films measured by spectroscopic ellipsometry.

作者信息

Alias Mohd Sharizal, Dursun Ibrahim, Saidaminov Makhsud I, Diallo Elhadj Marwane, Mishra Pawan, Ng Tien Khee, Bakr Osman M, Ooi Boon S

出版信息

Opt Express. 2016 Jul 25;24(15):16586-94. doi: 10.1364/OE.24.016586.

DOI:10.1364/OE.24.016586
PMID:27464113
Abstract

The lack of optical constants information for hybrid perovskite of CHNHPbBr in thin films form can delay the progress of efficient LED or laser demonstration. Here, we report on the optical constants (complex refractive index and dielectric function) of CHNHPbBr perovskite thin films using spectroscopic ellipsometry. Due to the existence of voids, the refractive index of the thin films is around 8% less than the single crystals counterpart. The energy bandgap is around 2.309 eV as obtained from photoluminescence and spectrophotometry spectra, and calculated from the SE analysis. The precise measurement of optical constants will be useful in designing optical devices using CHNHPbBr thin films.

摘要

缺乏薄膜形式的CHNHPbBr混合钙钛矿的光学常数信息可能会延迟高效发光二极管或激光演示的进展。在此,我们使用光谱椭偏仪报告了CHNHPbBr钙钛矿薄膜的光学常数(复折射率和介电函数)。由于存在空隙,薄膜的折射率比单晶对应物低约8%。通过光致发光和分光光度法光谱获得并根据椭偏光谱分析计算得出的能带隙约为2.309 eV。光学常数的精确测量将有助于设计使用CHNHPbBr薄膜的光学器件。

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