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Multilayer deformation planarization by substrate pit suturing.

作者信息

Chai Yingjie, Zhu Meiping, Xing Huanbin, Wang Hu, Cui Yun, Shao Jianda

出版信息

Opt Lett. 2016 Aug 1;41(15):3403-6. doi: 10.1364/OL.41.003403.

Abstract

In the pursuit of 1064 nm high-power laser resistance dielectric coatings in the nanosecond region, a group of HfO/SiO high reflectors with and without suture layers were prepared on prearranged fused silica substrates with femtosecond laser pits. Surface morphology, global coating stress, and high-resolution cross sections were characterized to determine the effects of substrate pit suturing. Laser-induced damage resistance was investigated for samples with and without suture layers. Our results indicate considerable stability in terms of the nanosecond 1064 nm laser-induced damage threshold for samples having a suture layer, due to decreased electronic field (e-field) deformation with simultaneous elimination of internal cracks. In addition, a suture layer formed by plasma ion-assisted deposition could effectively improve global mechanical stress of the coatings. By effectively reducing the multilayer deformation using a suture layer, electron-beam high-reflective coatings, whose laser-induced damage resistance was not influenced by the substrate pit, can be prepared.

摘要

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