Moreno-Flores Susana
Microsc Res Tech. 2016 Nov;79(11):1045-1049. doi: 10.1002/jemt.22742. Epub 2016 Aug 4.
This note reports on the proper correction of force data acquired with an atomic force microscope (AFM). The force-time representation is hereby used to obtain the correction factors for the overall offset and slope for a single force-time curve, as the initial force, F = F(t ), and the rate of change in the force per unit of time, dF/dt, respectively. The report shows that a complete set of force data, including the approach, delay and retraction regions, can be simultaneously corrected in the force-time representation by subtracting the line CL = F + dF/dt·t to the experimental data. The method described here outperforms the one commonly employed in the correction of AFM force curves and highlights the convenience of using the force-time representation for force data processing wherein the artifactual behavior can be expressed as a single, differentiable function of time.
本笔记报告了用原子力显微镜（AFM）获取的力数据的正确校正方法。在此，力-时间表示法用于获取单个力-时间曲线的整体偏移和斜率的校正因子，分别作为初始力F = F(t)和单位时间内力的变化率dF/dt。报告表明，通过从实验数据中减去直线CL = F + dF/dt·t，可以在力-时间表示法中同时校正包括接近、延迟和回缩区域在内的完整力数据集。这里描述的方法优于AFM力曲线校正中常用的方法，并突出了使用力-时间表示法进行力数据处理的便利性，其中人为行为可以表示为时间的单一可微函数。
