Jalalian Ezatollah, Zarbakhsh Arash, Mohtashamrad Zahra, Nourbakhsh Nazanin, Jafarpour Esmat
Associate Professor, Department of Fixed Prosthodontics, Dental Branch, Islamic Azad University, Tehran, Iran.
Assistant Professor, Department of Fixed Prosthodontics, Dental Branch, Azad University, Tehran, Iran.
J Dent (Tehran). 2015 Nov;12(11):815-22.
Marginal adaptation is important for long-term success of full-coverage restorations. The aim of this study was to determine the effect of porcelain firing cycle and different thicknesses of IPS e.max core on marginal accuracy of all-ceramic restorations.
A standard stainless steel die with 0.8 mm classic chamfer finish line and 10° taper was used in this in vitro study. An impression was taken from the stainless steel die to fabricate 20 epoxy resin dies, which were then scanned and IPS e.max CAD cores were fabricated using computer-aided design/computer-aided manufacturing (CAD/CAM) technique in two groups of 10 with 0.7 mm (group A) and 0.4mm (group B) core thickness. Copings were then placed on their respective dies and randomly numbered. The amount of marginal gap was measured in 10 points under a stereomicroscope (×90 magnification) before and after porcelain veneering.
The mean gap in 0.7mm and 0.4mm core thicknesses was 15.62±2.55μm and 19.68±3.09μm before porcelain firing and 32.01±3.19μm and 35.24±3.8μm after porcelain firing. The difference in marginal gap between the two thicknesses was significant before porcelain firing but not significant after veneering. Significant differences were also found in the marginal gap before and after porcelain veneering in each group.
The porcelain firing cycle increases marginal gap in IPS e.max CAD restorations; 0.3 mm decrease in core thickness slightly increased marginal discrepancy, however it was not significant.
边缘适合性对于全冠修复体的长期成功至关重要。本研究的目的是确定烤瓷烧制周期和不同厚度的IPS e.max核瓷对全瓷修复体边缘精度的影响。
本体外研究使用了一个具有0.8mm经典倒角肩台边缘线和10°锥度的标准不锈钢代型。从不锈钢代型上制取印模,制作20个环氧树脂代型,然后进行扫描,并使用计算机辅助设计/计算机辅助制造(CAD/CAM)技术制作两组IPS e.max CAD核瓷,每组10个,核瓷厚度分别为0.7mm(A组)和0.4mm(B组)。然后将基底冠放置在各自的代型上并随机编号。在烤瓷贴面前后,在体视显微镜(×90放大倍数)下的10个点测量边缘间隙量。
0.7mm和0.4mm核瓷厚度在烤瓷烧制前的平均间隙分别为15.62±2.55μm和19.68±3.09μm,烤瓷烧制后的平均间隙分别为32.01±3.19μm和35.24±3.8μm。两种厚度在烤瓷烧制前的边缘间隙差异有统计学意义,但在贴面后差异无统计学意义。每组在烤瓷贴面前后的边缘间隙也存在显著差异。
烤瓷烧制周期会增加IPS e.max CAD修复体的边缘间隙;核瓷厚度减少0.3mm会使边缘差异略有增加,但不显著。