Schneider Simon, Eppler Florian, Weber Marco, Olowojoba Ganiu, Weiss Patrick, Hübner Christof, Mikonsaari Irma, Freude Wolfgang, Koos Christian
Institute of Photonics and Quantum Electronics (IPQ), Karlsruhe Institute of Technology (KIT), 76131 Karlsruhe, Germany.
Fraunhofer Institute for Chemical Technology (ICT), 76327 Pfinztal, Germany.
Sci Rep. 2016 Aug 25;6:31733. doi: 10.1038/srep31733.
Nanocomposite materials represent a success story of nanotechnology. However, development of nanomaterial fabrication still suffers from the lack of adequate analysis tools. In particular, achieving and maintaining well-dispersed particle distributions is a key challenge, both in material development and industrial production. Conventional methods like optical or electron microscopy need laborious, costly sample preparation and do not permit fast extraction of nanoscale structural information from statistically relevant sample volumes. Here we show that optical coherence tomography (OCT) represents a versatile tool for nanomaterial characterization, both in a laboratory and in a production environment. The technique does not require sample preparation and is applicable to a wide range of solid and liquid material systems. Large particle agglomerates can be directly found by OCT imaging, whereas dispersed nanoparticles are detected by model-based analysis of depth-dependent backscattering. Using a model system of polystyrene nanoparticles, we demonstrate nanoparticle sizing with high accuracy. We further prove the viability of the approach by characterizing highly relevant material systems based on nanoclays or carbon nanotubes. The technique is perfectly suited for in-line metrology in a production environment, which is demonstrated using a state-of-the-art compounding extruder. These experiments represent the first demonstration of multiscale nanomaterial characterization using OCT.
纳米复合材料是纳米技术的一个成功范例。然而,纳米材料制造技术的发展仍然受到缺乏足够分析工具的困扰。特别是,在材料开发和工业生产中,实现并维持良好分散的颗粒分布是一项关键挑战。像光学或电子显微镜这样的传统方法需要繁琐、昂贵的样品制备过程,并且无法从具有统计相关性的样品体积中快速提取纳米级结构信息。在此,我们表明光学相干断层扫描(OCT)无论是在实验室还是生产环境中,都是用于纳米材料表征的一种多功能工具。该技术无需样品制备,适用于广泛的固体和液体材料系统。通过OCT成像可以直接发现大的颗粒团聚体,而通过基于深度相关背散射的模型分析来检测分散的纳米颗粒。使用聚苯乙烯纳米颗粒的模型系统,我们展示了高精度的纳米颗粒尺寸测量。我们通过对基于纳米粘土或碳纳米管的高度相关材料系统进行表征,进一步证明了该方法的可行性。该技术非常适合在生产环境中进行在线计量,这在使用先进的复合挤出机时得到了证明。这些实验首次展示了使用OCT进行多尺度纳米材料表征。