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半导体中超快载流子弛豫和非热相变过程中载流子倍增诱导的结构变化

Carrier-Multiplication-Induced Structural Change during Ultrafast Carrier Relaxation and Nonthermal Phase Transition in Semiconductors.

作者信息

Bang Junhyeok, Sun Y Y, Liu X-Q, Gao F, Zhang S B

机构信息

Department of Physics, Applied Physics, & Astronomy, Rensselaer Polytechnic Institute, Troy, New York 12180, USA.

Spin Engineering Physics Team, Korea Basic Science Institute (KBSI), Daejeon 305-806, Republic of Korea.

出版信息

Phys Rev Lett. 2016 Sep 16;117(12):126402. doi: 10.1103/PhysRevLett.117.126402. Epub 2016 Sep 13.

Abstract

While being extensively studied as an important physical process to alter exciton population in nanostructures at the fs time scale, carrier multiplication has not been considered seriously as a major mechanism for phase transition. Real-time time-dependent density functional theory study of Ge_{2}Sb_{2}Te_{5} reveals that carrier multiplication can induce an ultrafast phase transition in the solid state despite that the lattice remains cold. The results also unify the experimental findings in other semiconductors for which the explanation remains to be the 30-year old phenomenological plasma annealing model.

摘要

尽管载流子倍增作为一种在飞秒时间尺度上改变纳米结构中激子数量的重要物理过程受到了广泛研究,但它尚未被视为相变的主要机制。对Ge₂Sb₂Te₅的实时含时密度泛函理论研究表明,尽管晶格保持低温,但载流子倍增仍可在固态中诱导超快相变。这些结果还统一了其他半导体中的实验发现,而对这些发现的解释仍停留在30年前的唯象等离子体退火模型。

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