Hercules D M, Craig N L
J Dent Res. 1978 Feb;57(2):296-305. doi: 10.1177/00220345780570022601.
ESCA has been combined with argon-ion etching to obtain depth profiles for SnF2-treated enamel. Three zones of products from the topical treatment are detected: a layer of tin oxide on the surface; fluoroapatite + hydroxyapatite at depths below about 0.2 micron; an intermediate layer CaF2, Sn(OH)2, Sn2PO4OH, and fluoroapatite between the two. Sn3F3PO4 was not detected.
电子能谱化学分析（ESCA）已与氩离子蚀刻相结合，以获取经氟化亚锡处理的牙釉质的深度剖析图。检测到局部处理产生的三个产物区域：表面的一层氧化锡；深度约0.2微米以下的氟磷灰石+羟基磷灰石；两者之间的中间层，包含氟化钙、氢氧化锡、磷酸二氢锡和氟磷灰石。未检测到磷酸三氟锡。
