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微波平台作为表征纳米光子器件的一种有价值的工具。

Microwave platform as a valuable tool for characterization of nanophotonic devices.

作者信息

Shishkin Ivan, Baranov Dmitry, Slobozhanyuk Alexey, Filonov Dmitry, Lukashenko Stanislav, Samusev Anton, Belov Pavel

机构信息

ITMO University, Metamaterials Laboratory, St. Petersburg, 197101, Russia.

Institute for Analytical Instrumentation of RAS, St. Petersburg, 198095, Russia.

出版信息

Sci Rep. 2016 Oct 19;6:35516. doi: 10.1038/srep35516.

Abstract

The rich potential of the microwave experiments for characterization and optimization of optical devices is discussed. While the control of the light fields together with their spatial mapping at the nanoscale is still laborious and not always clear, the microwave setup allows to measure both amplitude and phase of initially determined magnetic and electric field components without significant perturbation of the near-field. As an example, the electromagnetic properties of an add-drop filter, which became a well-known workhorse of the photonics, is experimentally studied with the aid of transmission spectroscopy measurements in optical and microwave ranges and through direct mapping of the near fields at microwave frequencies. We demonstrate that the microwave experiments provide a unique platform for the comprehensive studies of electromagnetic properties of micro- and nanophotonic devices, and allow to obtain data which are hardly acquirable by conventional optical methods.

摘要

本文讨论了微波实验在光学器件表征和优化方面的巨大潜力。虽然在纳米尺度上对光场进行控制及其空间映射仍然很费力且并不总是清晰明确,但微波装置能够在不显著干扰近场的情况下,测量预先确定的磁场和电场分量的幅度和相位。例如,借助光学和微波波段的透射光谱测量以及微波频率下近场的直接映射,对作为光子学中著名的常用器件的分插复用滤波器的电磁特性进行了实验研究。我们证明,微波实验为微纳光子器件电磁特性的综合研究提供了一个独特的平台,并能够获取传统光学方法难以获得的数据。

https://cdn.ncbi.nlm.nih.gov/pmc/blobs/3e5f/5069494/7b0ca60da18c/srep35516-f1.jpg

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