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An optically-interrogated microwave-Poynting-vector sensor using cadmium manganese telluride.

作者信息

Chen Chia-Chu, Whitaker John F

机构信息

Department of Electrical Engineering and Computer Science, University of Michigan, Ann Arbor, MI 48109 USA.

出版信息

Opt Express. 2010 Jun 7;18(12):12239-48. doi: 10.1364/OE.18.012239.

DOI:10.1364/OE.18.012239
PMID:20588348
Abstract

A single <110> cadmium-manganese-telluride crystal that exhibits both the Pockels and Faraday effects is used to produce a Poynting-vector sensor for signals in the microwave regime. This multi-birefringent crystal can independently measure either electric or magnetic fields through control of the polarization of the optical probe beam. After obtaining all the relevant electric and magnetic field components, a map of the Poynting vector along a 50-Omega microstrip was experimentally determined without the need for any further transformational calculations. The results demonstrate that this sensor can be used for near-field mapping of the Poynting vector. Utilizing both amplitude and phase information from the fields in the microwave signal, it was confirmed for the case of an open-terminated microstrip that no energy flowed to the load, while for a microstrip with a matched termination, the energy flowed consistently along the transmission line.

摘要

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