在西门子软件中使用美国国家标准与技术研究院（NIST）晶体数据用于四圆和SMART CCD衍射仪。

Byram Susan K, Campana Charles F, Fait James, Sparks Robert A

Analytical Instrumentation Group, Siemens Energy and Automation, 6300 Enterprise Lane, Madison, WI 53719-1173.

J Res Natl Inst Stand Technol. 1996 May-Jun;101(3):295-300. doi: 10.6028/jres.101.030.

NIST Crystal Data developed at The National Institute for Standards and Technology has been incorporated with Siemens single crystal software for data collection on four-circle and two-dimensional CCD diffractometers. Why this database is useful in the process of single crystal structure determination, and how the database is searched, are described. Ideas for future access to this and other databases are presented.

美国国家标准与技术研究院开发的NIST晶体数据库已与西门子单晶软件集成，用于在四圆和二维电荷耦合器件衍射仪上进行数据收集。本文描述了该数据库在单晶结构测定过程中的用途以及如何搜索该数据库。还提出了未来访问此数据库及其他数据库的设想。