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通过紫外线臭氧处理铁电三元共聚物实现高迁移率、低电压工作的有机场效应晶体管非易失性存储器。

Achieving high mobility, low-voltage operating organic field-effect transistor nonvolatile memory by an ultraviolet-ozone treating ferroelectric terpolymer.

作者信息

Xiang Lanyi, Wang Wei, Xie Wenfa

机构信息

State Key Laboratory on Integrated Optoelectronics, College of Electronic Science and Engineering, Jilin University, 2699 Qianjin Street, Changchun 130012, China.

出版信息

Sci Rep. 2016 Nov 8;6:36291. doi: 10.1038/srep36291.

Abstract

Poly(vinylidene fluoride-trifluoroethylene) has been widely used as a dielectric of the ferroelectric organic field-effect transistor (FE-OFET) nonvolatile memory (NVM). Some critical issues, including low mobility and high operation voltage, existed in these FE-OFET NVMs, should be resolved before considering to their commercial application. In this paper, we demonstrated low-voltage operating FE-OFET NVMs based on a ferroelectric terpolymer poly(vinylidene-fluoride-trifluoroethylene-chlorotrifluoroethylene) [P(VDF-TrFE-CTFE)] owed to its low coercive field. By applying an ultraviolet-ozone (UVO) treatment to modify the surface of P(VDF-TrFE-CTFE) films, the growth model of the pentacene film was changed, which improved the pentacene grain size and the interface morphology of the pentacene/P(VDF-TrFE-CTFE). Thus, the mobility of the FE-OFET was significantly improved. As a result, a high performance FE-OFET NVM, with a high mobility of 0.8 cmVs, large memory window of 15.4~19.2, good memory on/off ratio of 10, the reliable memory endurance over 100 cycles and stable memory retention ability, was achieved at a low operation voltage of ±15 V.

摘要

聚(偏二氟乙烯-三氟乙烯)已被广泛用作铁电有机场效应晶体管(FE-OFET)非易失性存储器(NVM)的电介质。在考虑将这些FE-OFET NVM商业化应用之前,需要解决一些关键问题,包括低迁移率和高工作电压。在本文中,我们展示了基于铁电三元共聚物聚(偏二氟乙烯-三氟乙烯-氯三氟乙烯)[P(VDF-TrFE-CTFE)]的低电压工作FE-OFET NVM,这得益于其低矫顽场。通过应用紫外线臭氧(UVO)处理来修饰P(VDF-TrFE-CTFE)薄膜的表面,改变了并五苯薄膜的生长模式,从而改善了并五苯晶粒尺寸以及并五苯/P(VDF-TrFE-CTFE)的界面形态。因此,FE-OFET的迁移率得到了显著提高。结果表明,在±15 V的低工作电压下,实现了高性能的FE-OFET NVM,其迁移率高达0.8 cm²V⁻¹s⁻¹,记忆窗口大,为15.4~19.2,记忆开/关比良好,为10,具有超过100次循环的可靠记忆耐久性和稳定的记忆保持能力。

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