Ohta K, Yoshikawa M, Yasuhara R, Chikatsu M, Shima Y, Kohagura J, Sakamoto M, Nakasima Y, Imai T, Ichimura M, Yamada I, Funaba H, Minami T
Plasma Research Center, University of Tsukuba, 1-1-1 Tennodai, Tsukuba, Ibaraki 305-8577, Japan.
National Institute for Fusion Science, 322-6 Oroshi-cho, Toki, Gifu 509-5292, Japan.
Rev Sci Instrum. 2016 Nov;87(11):11E730. doi: 10.1063/1.4963161.
We have developed an analysis method to improve the accuracies of electron temperature measurement by employing a fitting technique for the raw Thomson scattering (TS) signals. Least square fitting of the raw TS signals enabled reduction of the error in the electron temperature measurement. We applied the analysis method to a multi-pass (MP) TS system. Because the interval between the MPTS signals is very short, it is difficult to separately analyze each Thomson scattering signal intensity by using the raw signals. We used the fitting method to obtain the original TS scattering signals from the measured raw MPTS signals to obtain the electron temperatures in each pass.
我们已经开发出一种分析方法，通过对原始汤姆逊散射（TS）信号采用拟合技术来提高电子温度测量的精度。对原始TS信号进行最小二乘拟合能够减少电子温度测量中的误差。我们将该分析方法应用于多程（MP）TS系统。由于MPTS信号之间的间隔非常短，使用原始信号单独分析每个汤姆逊散射信号强度很困难。我们使用拟合方法从测量的原始MPTS信号中获取原始TS散射信号，以得到每程中的电子温度。
