Kaasalainen Martti, Aseyev Vladimir, von Haartman Eva, Karaman Didem Şen, Mäkilä Ermei, Tenhu Heikki, Rosenholm Jessica, Salonen Jarno
Laboratory of Industrial Physics, Department of Physics and Astronomy, University of Turku, FI-20500, Turku, Finland.
Department of Chemistry, University of Helsinki, FI-00014 HY, Helsinki, Finland.
Nanoscale Res Lett. 2017 Dec;12(1):74. doi: 10.1186/s11671-017-1853-y. Epub 2017 Jan 25.
Silicon-based mesoporous nanoparticles have been extensively studied to meet the challenges in the drug delivery. Functionality of these nanoparticles depends on their properties which are often changing as a function of particle size and surrounding medium. Widely used characterization methods, dynamic light scattering (DLS), and transmission electron microscope (TEM) have both their weaknesses. We hypothesize that conventional light scattering (LS) methods can be used for a rigorous characterization of medium sensitive nanoparticles' properties, like size, stability, and porosity. Two fundamentally different silicon-based nanoparticles were made: porous silicon (PSi) from crystalline silicon and silica nanoparticles (SN) through sol-gel process. We studied the properties of these mesoporous nanoparticles with two different multiangle LS techniques, DLS and static light scattering (SLS), and compared the results to dry-state techniques, TEM, and nitrogen sorption. Comparison of particle radius from TEM and DLS revealed significant overestimation of the DLS result. Regarding to silica nanoparticles, the overestimation was attributed to agglomeration by analyzing radius of gyration and hydrodynamic radius. In case of PSi nanoparticles, strong correlation between LS result and specific surface area was found. Our results suggest that the multiangle LS methods could be used for the size, stability, and structure characterization of mesoporous nanoparticles.
为应对药物递送方面的挑战,硅基介孔纳米颗粒已得到广泛研究。这些纳米颗粒的功能取决于其性质,而这些性质通常会随着粒径和周围介质的变化而改变。广泛使用的表征方法,如动态光散射(DLS)和透射电子显微镜(TEM)都有其局限性。我们假设传统的光散射(LS)方法可用于严格表征对介质敏感的纳米颗粒的性质,如尺寸、稳定性和孔隙率。制备了两种本质上不同的硅基纳米颗粒:由晶体硅制成的多孔硅(PSi)和通过溶胶 - 凝胶法制备的二氧化硅纳米颗粒(SN)。我们用两种不同的多角度LS技术,即DLS和静态光散射(SLS)研究了这些介孔纳米颗粒的性质,并将结果与干态技术、TEM和氮吸附进行了比较。TEM和DLS测得的颗粒半径比较显示,DLS结果存在显著高估。对于二氧化硅纳米颗粒,通过分析回转半径和流体动力学半径,发现高估是由团聚引起的。对于PSi纳米颗粒,发现LS结果与比表面积之间存在很强的相关性。我们的结果表明,多角度LS方法可用于介孔纳米颗粒的尺寸、稳定性和结构表征。