Hnatovsky Cyril, Grobnic Dan, Coulas David, Barnes Michael, Mihailov Stephen J
Opt Lett. 2017 Feb 1;42(3):399-402. doi: 10.1364/OL.42.000399.
Periodic planar nanostructures are found in Type II-IR Bragg gratings produced in SMF-28 fiber by side-illuminating it with infrared femtosecond-laser pulses through a phase mask. The planar nanostructures are aligned perpendicular to the laser polarization, as demonstrated using scanning electron microscopy analysis of cleaved fiber samples. Dark field optical microscopy is employed for real-time monitoring of structural changes occurring inside the fiber during the inscription process.
通过相位掩膜用红外飞秒激光脉冲侧面照射SMF-28光纤所制备的II型红外布拉格光栅中发现了周期性平面纳米结构。如对劈开的光纤样品进行扫描电子显微镜分析所示,这些平面纳米结构与激光偏振方向垂直排列。暗场光学显微镜用于实时监测写入过程中光纤内部发生的结构变化。