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自组装单分子层中奇偶效应起源及基底粗糙度影响的光谱学证据。

Spectroscopic evidence for the origin of odd-even effects in self-assembled monolayers and effects of substrate roughness.

作者信息

Chen Jiahao, Liu Jian, Tevis Ian D, Andino Richard S, Miller Christina M, Ziegler Lawrence D, Chen Xin, Thuo Martin M

机构信息

Department of Materials Science and Engineering, Iowa State University, Ames, Iowa 50011, USA.

Department of Chemistry and the Photonics Centre, Boston University, Boston, MA 02215, USA.

出版信息

Phys Chem Chem Phys. 2017 Mar 8;19(10):6989-6995. doi: 10.1039/c6cp07580k.

Abstract

This paper reports the effects of substrate roughness on the odd-even effect in n-alkanethiolate self-assembled monolayers (SAMs) probed by vibrational sum frequency generation (SFG) spectroscopy. By fabricating SAMs on surfaces across the so-called odd-even limit, we demonstrate that differentiation of the vibrational frequencies of CH from SAMs derived from alkyl thiols with either odd (SAM) or even (SAM) numbers of carbons depends on the roughness of the substrate on which they are formed. Odd-even oscillation in SFG susceptibility amplitudes was observed for spectra derived from SAM and SAM fabricated on flat surfaces (RMS roughness = 0.4 nm) but not on rougher surfaces (RMS roughness = 2.38 nm). In addition, we discovered that local chemical environments for the terminal CH group have a chain-length dependence. There seems to be a transition at around C, beyond which SAMs become "solid-like".

摘要

本文报道了通过振动和频产生(SFG)光谱探测的底物粗糙度对正烷硫醇自组装单分子层(SAMs)中奇偶效应的影响。通过在跨越所谓奇偶极限的表面上制备SAMs,我们证明了来自具有奇数(SAM)或偶数(SAM)碳原子数的烷基硫醇的SAMs中CH振动频率的差异取决于它们所形成的底物的粗糙度。在平坦表面(均方根粗糙度 = 0.4 nm)上制备的SAM和SAM的光谱中观察到SFG磁化率振幅的奇偶振荡,但在较粗糙表面(均方根粗糙度 = 2.38 nm)上未观察到。此外,我们发现末端CH基团的局部化学环境具有链长依赖性。在C左右似乎存在一个转变,超过该转变后SAMs变得“类固态”。

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