Department of Chemistry, The Pennsylvania State University, 104 Chemistry Building, University Park, PA, 16802, USA.
Fakultät für Physik, Universität Duisburg-Essen, 47048, Duisburg, Germany.
J Am Soc Mass Spectrom. 2017 Jun;28(6):1182-1191. doi: 10.1007/s13361-017-1624-0. Epub 2017 Mar 6.
The prospect of improved secondary ion yields for secondary ion mass spectrometry (SIMS) experiments drives innovation of new primary ion sources, instrumentation, and post-ionization techniques. The largest factor affecting secondary ion efficiency is believed to be the poor ionization probability (α) of sputtered material, a value rarely measured directly, but estimated to be in some cases as low as 10. Our lab has developed a method for the direct determination of α in a SIMS experiment using laser post-ionization (LPI) to detect neutral molecular species in the sputtered plume for an organic compound. Here, we apply this method to coronene (CH), a polyaromatic hydrocarbon that exhibits strong molecular signal during gas-phase photoionization. A two-dimensional spatial distribution of sputtered neutral molecules is measured and presented. It is shown that the ionization probability of molecular coronene desorbed from a clean film under bombardment with 40 keV C cluster projectiles is of the order of 10, with some remaining uncertainty arising from laser-induced fragmentation and possible differences in the emission velocity distributions of neutral and ionized molecules. In general, this work establishes a method to estimate the ionization efficiency of molecular species sputtered during a single bombardment event. Graphical Abstract .
二次离子质谱(SIMS)实验中提高二次离子产率的前景推动了新型一次离子源、仪器和后电离技术的创新。影响二次离子效率的最大因素被认为是溅射材料的电离概率(α)低,这个值很少直接测量,但在某些情况下估计低至 10。我们实验室开发了一种在 SIMS 实验中直接确定α的方法,使用激光后电离(LPI)来检测溅射羽流中的中性分子种类,用于有机化合物。在这里,我们将该方法应用于并苯(CH),这是一种多环芳烃,在气相光电离过程中表现出强烈的分子信号。测量并呈现了溅射中性分子的二维空间分布。结果表明,在 40keV C 团簇射弹轰击下,从清洁膜上解吸的分子并苯的电离概率约为 10,由于激光诱导的碎裂和中性分子与离子化分子的发射速度分布可能存在差异,仍存在一些不确定性。总的来说,这项工作建立了一种估计单次轰击事件中溅射分子种类电离效率的方法。