Department of Bioengineering, NESAC/BIO, University of Washington, Seattle, Washington 98195.
Biointerphases. 2023 Mar 29;18(2):021201. doi: 10.1116/6.0002477.
Time-of-flight secondary ion mass spectrometry (ToF-SIMS) is used widely throughout industrial and academic research due to the high information content of the chemically specific data it produces. Modern ToF-SIMS instruments can generate high mass resolution data that can be displayed as spectra and images (2D and 3D). This enables determining the distribution of molecules across and into a surface and provides access to information not obtainable from other methods. With this detailed chemical information comes a steep learning curve in how to properly acquire and interpret the data. This Tutorial is aimed at helping ToF-SIMS users to plan for and collect ToF-SIMS data. The second Tutorial in this series will cover how to process, display, and interpret ToF-SIMS data.
飞行时间二次离子质谱（ToF-SIMS）由于其产生的化学特异性数据信息量高，因此在工业和学术研究中得到了广泛应用。现代 ToF-SIMS 仪器可以生成高质量分辨率的数据，可以显示为光谱和图像（2D 和 3D）。这使得可以确定分子在表面上和进入表面的分布，并提供了其他方法无法获得的信息。随着这种详细的化学信息的出现，如何正确获取和解释数据的学习曲线变得陡峭。本教程旨在帮助 ToF-SIMS 用户规划和收集 ToF-SIMS 数据。本系列的第二个教程将介绍如何处理、显示和解释 ToF-SIMS 数据。
