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回到生物相关样品飞行时间二次离子质谱的基础上来。I. 仪器和数据采集。

Back to the basics of time-of-flight secondary ion mass spectrometry of bio-related samples. I. Instrumentation and data collection.

机构信息

Department of Bioengineering, NESAC/BIO, University of Washington, Seattle, Washington 98195.

出版信息

Biointerphases. 2023 Mar 29;18(2):021201. doi: 10.1116/6.0002477.

Abstract

Time-of-flight secondary ion mass spectrometry (ToF-SIMS) is used widely throughout industrial and academic research due to the high information content of the chemically specific data it produces. Modern ToF-SIMS instruments can generate high mass resolution data that can be displayed as spectra and images (2D and 3D). This enables determining the distribution of molecules across and into a surface and provides access to information not obtainable from other methods. With this detailed chemical information comes a steep learning curve in how to properly acquire and interpret the data. This Tutorial is aimed at helping ToF-SIMS users to plan for and collect ToF-SIMS data. The second Tutorial in this series will cover how to process, display, and interpret ToF-SIMS data.

摘要

飞行时间二次离子质谱(ToF-SIMS)由于其产生的化学特异性数据信息量高,因此在工业和学术研究中得到了广泛应用。现代 ToF-SIMS 仪器可以生成高质量分辨率的数据,可以显示为光谱和图像(2D 和 3D)。这使得可以确定分子在表面上和进入表面的分布,并提供了其他方法无法获得的信息。随着这种详细的化学信息的出现,如何正确获取和解释数据的学习曲线变得陡峭。本教程旨在帮助 ToF-SIMS 用户规划和收集 ToF-SIMS 数据。本系列的第二个教程将介绍如何处理、显示和解释 ToF-SIMS 数据。

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Gas Cluster Ion Beams for Secondary Ion Mass Spectrometry.气体团簇离子束用于二次离子质谱分析。
Annu Rev Anal Chem (Palo Alto Calif). 2018 Jun 12;11(1):29-48. doi: 10.1146/annurev-anchem-061516-045249. Epub 2018 Feb 28.

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