Alania M, Altantzis T, De Backer A, Lobato I, Bals S, Van Aert S
Electron Microscopy for Materials Science (EMAT), University of Antwerp, Groenenborgerlaan 171, 2020 Antwerp, Belgium.
Electron Microscopy for Materials Science (EMAT), University of Antwerp, Groenenborgerlaan 171, 2020 Antwerp, Belgium.
Ultramicroscopy. 2017 Jun;177:36-42. doi: 10.1016/j.ultramic.2016.11.002. Epub 2016 Nov 9.
Aberration correction in scanning transmission electron microscopy (STEM) has greatly improved the lateral and depth resolution. When using depth sectioning, a technique during which a series of images is recorded at different defocus values, single impurity atoms can be visualised in three dimensions. In this paper, we investigate new possibilities emerging when combining depth sectioning and precise atom-counting in order to reconstruct nanosized particles in three dimensions. Although the depth resolution does not allow one to precisely locate each atom within an atomic column, it will be shown that the depth location of an atomic column as a whole can be measured precisely. In this manner, the morphology of a nanoparticle can be reconstructed in three dimensions. This will be demonstrated using simulations and experimental data of a gold nanorod.
扫描透射电子显微镜（STEM）中的像差校正极大地提高了横向和深度分辨率。在使用深度切片技术时，即在不同散焦值下记录一系列图像的过程中，可以在三维空间中观察到单个杂质原子。在本文中，我们研究了将深度切片与精确原子计数相结合以三维重建纳米颗粒时出现的新可能性。尽管深度分辨率不允许精确确定原子柱内的每个原子，但将表明可以精确测量整个原子柱的深度位置。通过这种方式，可以在三维空间中重建纳米颗粒形态。这将通过金纳米棒的模拟和实验数据得到证明。
