Sakalli Y, Trettin R
Institute for Building and Materials Chemistry, University of Siegen, 57076, Siegen, Germany.
J Microsc. 2017 Jul;267(1):81-88. doi: 10.1111/jmi.12549. Epub 2017 Mar 22.
Tricalciumsilicate (C S, Alite) is the major component of the Portland cement clinker. Hydration of Alite is decisive in influencing the properties of the resulting material. This is due to its high content in cement. The mechanism of the hydration of C S is very complicated and not yet fully understood. There are different models describing the hydration of C S in various ways. In this work for a better understanding of hydration mechanism, the hydrated C S was investigated by using the transmission electron microscope (TEM) and for the first time, the samples for the investigations were prepared by using of focused ion beam from sintered pellets of C S. Also, an FEI Talos F200x with an integrated Super-X EDS system was used for the investigations. FEI Talos F200X combines outstanding high-resolution S/TEM and TEM imaging with energy dispersive X-ray spectroscopy signal detection, and 3D chemical characterization with compositional mapping. TEM is a very powerful tool for material science. A high energy beam of electrons passes through a very thin sample, and the interactions between the electrons and the atoms can be used to observe the structure of the material and other features in the structure. TEM can be used to study the growth of layers and their composition. TEM produces high-resolution, two-dimensional images and will be used for a wide range of educational, science and industry applications. Chemical analysis can also be performed. The purpose of these investigations was to get the information about the composition of the C-S-H phases and some details of the nanostructure of the C-S-H phases.
硅酸三钙(C₃S,阿利特)是波特兰水泥熟料的主要成分。阿利特的水化对于影响最终材料的性能起决定性作用。这是因为它在水泥中的含量很高。C₃S的水化机理非常复杂,尚未完全被理解。有不同的模型以各种方式描述C₃S的水化。在这项工作中,为了更好地理解水化机理,通过使用透射电子显微镜(TEM)对水化的C₃S进行了研究,并且首次通过使用聚焦离子束从C₃S的烧结球粒制备用于研究的样品。此外,还使用了配备集成Super-X能谱仪系统的FEI Talos F200x进行研究。FEI Talos F200X将出色的高分辨率扫描透射电子显微镜(S/TEM)和透射电子显微镜成像与能量色散X射线光谱信号检测以及具有成分映射的三维化学表征相结合。透射电子显微镜是材料科学中一种非常强大的工具。高能电子束穿过非常薄的样品,电子与原子之间的相互作用可用于观察材料的结构和结构中的其他特征。透射电子显微镜可用于研究层的生长及其组成。透射电子显微镜产生高分辨率的二维图像,并将用于广泛的教育、科学和工业应用。也可以进行化学分析。这些研究的目的是获取有关C-S-H相组成的信息以及C-S-H相纳米结构的一些细节。