Laboratory of Industrial Chemistry, ‡Analytical Chemistry - Center for Electrochemical Sciences (CES), §Mechanical Workshop of the Faculty of Chemistry and Biochemistry, Ruhr-Universität Bochum , Universitätsstr. 150, D-44780 Bochum, Germany.
Anal Chem. 2017 Apr 18;89(8):4367-4372. doi: 10.1021/acs.analchem.6b03732. Epub 2017 Mar 31.
A spectroelectrochemical cell is presented that allows investigations of electrochemical reactions by means of attenuated total reflection infrared (ATR-IR) spectroscopy. The electrode holder for the working (WE), counter and reference electrode as mounted in the IR spectrometer cause the formation of a thin electrolyte layer between the internal reflection element (IRE) and the surface of the WE. The thickness of this thin electrolyte layer (d) was estimated by performing a scanning electrochemical microscopy-(SECM) like approach of a Pt microelectrode (ME), which was leveled with the WE toward the IRE surface. The precise lowering of the ME/WE plane toward the IRE was enabled by a micrometer screw. The approach curve was recorded in negative feedback mode of SECM and revealed the contact point of the ME and WE on the IRE, which was used as reference point to perform the electro-oxidation of ethanol over a drop-casted Pd/NCNT catalyst on the WE at different thin-layer thicknesses by cyclic voltammetry. The reaction products were detected in the liquid electrolyte by IR spectroscopy, and the effect of variations in d on the current densities and IR spectra were analyzed and discussed. The obtained data identify d as an important variable in thin-layer experiments with electrochemical reactions and FTIR readout.
介绍了一种通过衰减全反射红外(ATR-IR)光谱法研究电化学反应的光谱电化学池。安装在红外光谱仪中的工作电极(WE)、对电极和参比电极的电极支架在内部反射元件(IRE)和 WE 表面之间形成了一层薄的电解质层。通过对与 WE 平齐的 Pt 微电极(ME)进行类似于扫描电化学显微镜(SECM)的方法来估计该薄电解质层(d)的厚度,微电极(ME)向 IRE 表面逐渐靠近。通过千分尺螺杆精确地降低 ME/WE 平面朝向 IRE,记录负反馈模式下的接近曲线,从而揭示了 ME 和 WE 在 IRE 上的接触点,该接触点被用作参考点,以在不同的薄层厚度下通过循环伏安法在 WE 上的滴铸 Pd/NCNT 催化剂上进行乙醇的电氧化。通过红外光谱法在液体电解质中检测到反应产物,并分析和讨论了 d 的变化对电流密度和 IR 光谱的影响。所得数据表明,d 是电化学反应和 FTIR 读出的薄层实验中的一个重要变量。