Zhang Jinshui, Yuan Zhoumiqi, Shuai Guanyuan, Pan Yaozhong, Zhu Xiufang
Department of Geography, Beijing Normal University, State Key Laboratory of Earth Surface Processes and Resource Ecology, Beijing 100875, China.
Department of Resources Science and Technology, Beijing Normal University, College of Resources Science and Technology, Beijing 100875, China.
Sensors (Basel). 2017 Apr 26;17(5):960. doi: 10.3390/s17050960.
This paper developed an approach, the window-based validation set for support vector data description (WVS-SVDD), to determine optimal parameters for support vector data description (SVDD) model to map specific land cover by integrating training and window-based validation sets. Compared to the conventional approach where the validation set included target and outlier pixels selected visually and randomly, the validation set derived from WVS-SVDD constructed a tightened hypersphere because of the compact constraint by the outlier pixels which were located neighboring to the target class in the spectral feature space. The overall accuracies for wheat and bare land achieved were as high as 89.25% and 83.65%, respectively. However, target class was underestimated because the validation set covers only a small fraction of the heterogeneous spectra of the target class. The different window sizes were then tested to acquire more wheat pixels for validation set. The results showed that classification accuracy increased with the increasing window size and the overall accuracies were higher than 88% at all window size scales. Moreover, WVS-SVDD showed much less sensitivity to the untrained classes than the multi-class support vector machine (SVM) method. Therefore, the developed method showed its merits using the optimal parameters, tradeoff coefficient () and kernel width (), in mapping homogeneous specific land cover.
本文提出了一种基于窗口的支持向量数据描述验证集(WVS-SVDD)方法,通过整合训练集和基于窗口的验证集来确定支持向量数据描述(SVDD)模型的最佳参数,以映射特定的土地覆盖类型。与传统方法不同,传统方法中验证集包含通过视觉和随机方式选择的目标像素和异常像素,而基于WVS-SVDD得出的验证集由于在光谱特征空间中位于目标类相邻位置的异常像素的紧凑约束,构建了一个更紧凑的超球体。小麦和裸地的总体准确率分别高达89.25%和83.65%。然而,目标类被低估了,因为验证集仅覆盖了目标类异质光谱的一小部分。然后测试了不同的窗口大小,以获取更多用于验证集的小麦像素。结果表明,分类准确率随着窗口大小的增加而提高,在所有窗口大小尺度下总体准确率均高于88%。此外,与多类支持向量机(SVM)方法相比,WVS-SVDD对未训练类的敏感性要低得多。因此,所开发的方法在映射同质特定土地覆盖类型时,使用最佳参数、权衡系数()和核宽度()显示出其优点。