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任意切割单斜晶体的广义色散分析

Generalized dispersion analysis of arbitrarily cut monoclinic crystals.

作者信息

Höfer Sonja, Ivanovski Vladimir, Uecker Reinhard, Kwasniewski Albert, Popp Jürgen, Mayerhöfer Thomas G

机构信息

Leibniz-Institut für Photonische Technologien e.V., Albert-Einstein-Straße 9, D-07745 Jena, Germany.

Institute of Chemistry, Faculty of Natural Sciences and Mathematics, Sts. Cyril and Methodius University, Arhimedova 5, 1000 Skopje, Macedonia.

出版信息

Spectrochim Acta A Mol Biomol Spectrosc. 2017 Oct 5;185:217-227. doi: 10.1016/j.saa.2017.05.039. Epub 2017 May 24.

Abstract

Dispersion analysis is applicable to arbitrarily cut monoclinic crystals of unknown orientation in order to find the symmetry axis. By this it is possible to differentiate between the transition moments oriented parallel and normal to the b-axis and to determine the dielectric tensor functions of those two principal directions. Dispersion analysis of arbitrarily cut monoclinic crystals is based on an extension of the evaluation scheme developed for arbitrarily cut orthorhombic crystals. We present dispersion analysis of monoclinic crystals exemplarily on spodumene (LiAl(SiO)) and yttrium orthosilicate (YSiO).

摘要

色散分析适用于任意切割的、取向未知的单斜晶体,以找到对称轴。通过这种方法,可以区分平行于和垂直于b轴的跃迁矩,并确定这两个主方向的介电张量函数。任意切割的单斜晶体的色散分析基于为任意切割的正交晶体开发的评估方案的扩展。我们以锂辉石(LiAl(SiO))和正硅酸钇(YSiO)为例,介绍单斜晶体的色散分析。

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