Liu Xin, Chen Bowen, Tu Bingtian, Wang Hao, Wang Weimin, Fu Zhengyi
State Key Lab of Advanced Technology for Materials Synthesis and Processing, Wuhan University of Technology, Wuhan 430070, China.
Materials (Basel). 2017 Jul 13;10(7):792. doi: 10.3390/ma10070792.
Transparent MgAlON:Ce fluorescent ceramics with doping content of 0.005, 0.01, and 0.02 at % were fabricated by pressureless sintering. All the samples were dense and large in grain size. Under the excitation of 320 nm UV, the samples emitted blue lights centered around 410 nm. The 0.005 and 0.01 at % Ce doped samples were single phase by XRD detection, and possessed good optical and mechanical properties, and luminous thermal stability. The fluorescence lifetime, the CL and PL spectra analysis, indicated that most of the luminous centers were segregated in GB, and there was still a small part of second phase existing in 0.01 at % Ce doped sample, which revealed that spectroscopy methods possessed better sensitivity in smaller scale and lower concentration detection than XRD. As the doping content increasing to 0.02 at %, a mass of second phase arose, which resulted in the optical transparency, mechanical property, luminous thermal stability decline, and the PL spectra red shift by the formation of second phase. It revealed that the performances were fatally deteriorated by excess doping of Ce ions.
通过无压烧结制备了掺杂含量为0.005、0.01和0.02原子百分比的透明MgAlON:Ce荧光陶瓷。所有样品均致密且晶粒尺寸较大。在320nm紫外光激发下，样品发射出以410nm为中心的蓝光。通过XRD检测，0.005和0.01原子百分比Ce掺杂的样品为单相，具有良好的光学和机械性能以及发光热稳定性。荧光寿命、CL和PL光谱分析表明，大部分发光中心偏聚在晶界，0.01原子百分比Ce掺杂样品中仍存在少量第二相，这表明光谱方法在较小尺度和较低浓度检测方面比XRD具有更好的灵敏度。当掺杂含量增加到0.02原子百分比时，出现大量第二相，导致光学透明度、机械性能、发光热稳定性下降，且PL光谱因第二相的形成而红移。这表明Ce离子的过量掺杂会严重恶化材料性能。
