Fan Jiajie, Mohamed Moumouni Guero, Qian Cheng, Fan Xuejun, Zhang Guoqi, Pecht Michael
College of Mechanical and Electrical Engineering, Hohai University, Changzhou 213022, China.
Changzhou Institute of Technology Research for Solid State Lighting, Changzhou 213161, China.
Materials (Basel). 2017 Jul 18;10(7):819. doi: 10.3390/ma10070819.
With the expanding application of light-emitting diodes (LEDs), the color quality of white LEDs has attracted much attention in several color-sensitive application fields, such as museum lighting, healthcare lighting and displays. Reliability concerns for white LEDs are changing from the luminous efficiency to color quality. However, most of the current available research on the reliability of LEDs is still focused on luminous flux depreciation rather than color shift failure. The spectral power distribution (SPD), defined as the radiant power distribution emitted by a light source at a range of visible wavelength, contains the most fundamental luminescence mechanisms of a light source. SPD is used as the quantitative inference of an LED's optical characteristics, including color coordinates that are widely used to represent the color shift process. Thus, to model the color shift failure of white LEDs during aging, this paper first extracts the features of an SPD, representing the characteristics of blue LED chips and phosphors, by multi-peak curve-fitting and modeling them with statistical functions. Then, because the shift processes of extracted features in aged LEDs are always nonlinear, a nonlinear state-space model is then developed to predict the color shift failure time within a self-adaptive particle filter framework. The results show that: (1) the failure mechanisms of LEDs can be identified by analyzing the extracted features of SPD with statistical curve-fitting and (2) the developed method can dynamically and accurately predict the color coordinates, correlated color temperatures (CCTs), and color rendering indexes (CRIs) of phosphor-converted (pc)-white LEDs, and also can estimate the residual color life.
随着发光二极管(LED)应用范围的不断扩大,白光LED的颜色质量在博物馆照明、医疗照明和显示器等几个对颜色敏感的应用领域中备受关注。白光LED的可靠性关注点正从发光效率转变为颜色质量。然而,目前关于LED可靠性的现有研究大多仍集中在光通量衰减而非颜色偏移失效上。光谱功率分布(SPD)定义为光源在一系列可见波长下发射的辐射功率分布,它包含了光源最基本的发光机制。SPD被用作LED光学特性的定量推断,包括广泛用于表示颜色偏移过程的色坐标。因此,为了模拟老化过程中白光LED的颜色偏移失效,本文首先通过多峰曲线拟合并使用统计函数对其进行建模,提取代表蓝色LED芯片和荧光粉特性的SPD特征。然后,由于老化LED中提取特征的偏移过程总是非线性的,于是开发了一种非线性状态空间模型,以在自适应粒子滤波器框架内预测颜色偏移失效时间。结果表明:(1)通过用统计曲线拟合分析提取的SPD特征,可以识别LED的失效机制;(2)所开发的方法可以动态、准确地预测磷光转换(pc)白光LED的色坐标、相关色温(CCT)和显色指数(CRI),还可以估计剩余颜色寿命。