Bi-directional top-hat D-Scan: single beam accurate characterization of nonlinear waveguides.

The characterization of a third-order nonlinear integrated waveguide is reported for the first time by means of a top-hat dispersive-scan (D-Scan) technique, a temporal analog of the top-hat Z-Scan. With a single laser beam, and by carrying two counterdirectional nonlinear transmissions to assess the input and output coupling efficiencies, a novel procedure is described leading to accurate measurement of the TPA figure of merit, the effective two-photon absorption (TPA), and optical Kerr (including the sign) coefficients. The technique is validated in a silicon strip waveguide for which the effective nonlinear coefficients are measured with an accuracy of ±10%.