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YAG:Ce,Cr荧光粉中785纳米处的宽发射。

The broad emission at 785nm in YAG:Ce,Cr phosphor.

作者信息

Zhou Xianju, Luo Xiaoxia, Wu Bing, Jiang Sha, Li Li, Luo Xiaobing, Pang Yu

机构信息

College of Science, Chongqing University of Posts and Telecommunications, Chongqing 400065, PR China.

College of Science, Chongqing University of Posts and Telecommunications, Chongqing 400065, PR China.

出版信息

Spectrochim Acta A Mol Biomol Spectrosc. 2018 Feb 5;190:76-80. doi: 10.1016/j.saa.2017.09.011. Epub 2017 Sep 8.

Abstract

Luminescence of defects and/or impurities is important for phosphors. One broad emission band centered at 785nm was observed in (YCe)(AlCr)O (x=0.005, 0.01, 0.03, 0.06, 0.09), (YAG:Ce,Cr) nano-particles synthesized by polymer-assisted sol-gel method in this work. In order to study the source of this wide emission band, the crystalline phase structure of the phosphors was examined by X-ray diffraction (XRD). No obvious diffraction peaks due to impurity phase were observed even though the calcining temperature of the samples arrived at 1400°C. The anti-site defects were excluded. No detectable signals of impurities were obtained by X-ray Photoelectron Spectroscopy (XPS) or inductively coupled plasma mass spectrometry (ICP-MS). Based on the photo-luminescence results of YAG:Ce,Cr, YAG:Ce and YAG:Fe phosphors, the wide emission band is attributed to the T(G)→A(S) transition from the trace impurity of Fe. The excitation band at 280nm is assigned to Fe-O charge transfer band.

摘要

缺陷和/或杂质的发光对于磷光体很重要。在本工作中通过聚合物辅助溶胶-凝胶法合成的(YCe)(AlCr)O(x = 0.005、0.01、0.03、0.06、0.09)、(YAG:Ce,Cr)纳米颗粒中观察到一个以785nm为中心的宽发射带。为了研究这个宽发射带的来源,通过X射线衍射(XRD)对磷光体的晶相结构进行了检测。即使样品的煅烧温度达到1400°C,也未观察到由于杂质相引起的明显衍射峰。排除了反位缺陷。通过X射线光电子能谱(XPS)或电感耦合等离子体质谱(ICP-MS)未获得可检测到的杂质信号。基于YAG:Ce,Cr、YAG:Ce和YAG:Fe磷光体的光致发光结果,该宽发射带归因于痕量杂质Fe的T(G)→A(S)跃迁。280nm处的激发带归属于Fe-O电荷转移带。

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