Department of Physics and Astronomy, University of Bologna , 40127 Bologna, Italy.
Department of Electrical and Electronic Engineering, University of Cagliari , 09123 Cagliari, Italy.
ACS Appl Mater Interfaces. 2017 Oct 11;9(40):35150-35158. doi: 10.1021/acsami.7b08440. Epub 2017 Sep 29.
Organic electronic devices fabricated on flexible substrates are promising candidates for applications in environments where flexible, lightweight, and radiation hard materials are required. In this work, device parameters such as threshold voltage, charge mobility, and trap density of 13-bis(triisopropylsilylethynyl)pentacene (TIPS-pentacene)-based organic thin-film transistors (OTFTs) have been monitored for performing electrical measurements before and after irradiation by high-energy protons. The observed reduction of charge carrier mobility following irradiation can be only partially ascribed to the increased trap density. Indeed, we used other techniques to identify additional effects induced by proton irradiation in such devices. Atomic force microscopy reveals morphological defects occurring in the organic dielectric layer induced by the impinging protons, which, in turn, induce a strain on the TIPS-pentacene crystallites lying above. The effects of this strain are investigated by density functional theory simulations of two model structures, which describe the TIPS-pentacene crystalline films at equilibrium and under strain. The two different density of states distributions in the valence band have been correlated with the photocurrent spectra acquired before and after proton irradiation. We conclude that the degradation of the dielectric layer and the organic semiconductor sensitivity to strain are the two main phenomena responsible for the reduction of OTFT mobility after proton irradiation.
在柔性衬底上制造的有机电子器件是在需要柔性、轻量和耐辐射材料的环境中应用的有前途的候选者。在这项工作中,我们监测了基于 13-双(三异丙基硅基乙炔基)戊二烯(TIPS-戊二烯)的有机薄膜晶体管(OTFT)的器件参数,如阈值电压、电荷迁移率和陷阱密度,以便在高能质子辐照前后进行电测量。观察到辐照后电荷载流子迁移率的降低只能部分归因于陷阱密度的增加。事实上,我们使用其他技术来识别这种器件中由质子辐照引起的其他影响。原子力显微镜揭示了入射质子在有机介电层中引起的形态缺陷,这反过来又对位于其上方的 TIPS-戊二烯微晶施加应变。通过对两个模型结构的密度泛函理论模拟研究了这种应变的影响,这两个模型结构描述了平衡和应变下的 TIPS-戊二烯晶膜。价带中的两个不同的态密度分布与质子辐照前后获得的光电流光谱相关联。我们得出结论,介电层的降解和有机半导体对应变的敏感性是质子辐照后 OTFT 迁移率降低的两个主要现象。